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X-RAY DIFFRACTION
Materials and Methods page
4B4S
  •   Crystallization Hide
    Crystallization Experiments
    pH 8
    Details 0.1 M MGCL2, 20 % PEG 400, 20 % PEG 3350, 0.1 M TRIS PH 8.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 39.84 α = 90
    b = 94.85 β = 90
    c = 96.37 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2009-11-01
     
    Diffraction Radiation
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX2
    Wavelength 0.957
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.9
    Resolution(Low) 19.92
    Number Reflections(Observed) 14793
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 26.72
    Redundancy 7.2
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.88
    Mean I Over Sigma(Observed) 2.5
    Redundancy 7.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 1.9
    Resolution(Low) 19.614
    Cut-off Sigma(F) 1.38
    Number of Reflections(Observed) 14768
    Number of Reflections(R-Free) 747
    Percent Reflections(Observed) 99.97
    R-Factor(Observed) 0.1974
    R-Work 0.1962
    R-Free 0.2198
     
    Temperature Factor Modeling
    Mean Isotropic B Value 37.19
    Anisotropic B[1][1] -2.4229
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 8.5362
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -6.1133
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 2.0466
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2744
    R-Factor(R-Work) 0.2417
    R-Factor(R-Free) 0.2551
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0466
    Shell Resolution(Low) 2.2523
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2751
    R-Factor(R-Work) 0.201
    R-Factor(R-Free) 0.2431
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2523
    Shell Resolution(Low) 2.5775
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2792
    R-Factor(R-Work) 0.1827
    R-Factor(R-Free) 0.1931
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5775
    Shell Resolution(Low) 3.2451
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2802
    R-Factor(R-Work) 0.1822
    R-Factor(R-Free) 0.2189
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2451
    Shell Resolution(Low) 19.6147
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2932
    R-Factor(R-Work) 0.1986
    R-Factor(R-Free) 0.2164
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.048
    f_dihedral_angle_d 13.954
    f_angle_d 0.877
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1356
    Nucleic Acid Atoms 0
    Heterogen Atoms 13
    Solvent Atoms 88
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHENIX
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHENIX