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X-RAY DIFFRACTION
Materials and Methods page
4B4A
  •   Crystallization Hide
    Crystallization Experiments
    pH 4
    Details 0.2M AMMONIUM SULPHATE, 0.02M NACL, 0.02M SODIUM ACETATE PH4.0, 33% V/V PEG 200
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 123.52 α = 90
    b = 123.52 β = 90
    c = 216.41 γ = 120
     
    Space Group
    Space Group Name:    H 3 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL (PILATUS 6M)
    Type DECTRIS
    Collection Date 2012-05-30
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04-1
    Wavelength 0.92
    Site DIAMOND
    Beamline I04-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3.5
    Resolution(Low) 15
    Number Reflections(Observed) 7820
    Percent Possible(Observed) 96.8
    R Merge I(Observed) 0.03
    B(Isotropic) From Wilson Plot 132.26
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 3.5
    Resolution(Low) 3.6
    Percent Possible(All) 96.6
    R Merge I(Observed) 0.95
    Mean I Over Sigma(Observed) 1.4
    Redundancy 3.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 3.5
    Resolution(Low) 22.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 7900
    Number of Reflections(R-Free) 386
    Percent Reflections(Observed) 96.29
    R-Factor(Observed) 0.2535
    R-Work 0.2518
    R-Free 0.2882
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 159.38
    Anisotropic B[1][1] -18.3276
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -18.3276
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 36.6553
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5
    Shell Resolution(Low) 3.91
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2053
    R-Factor(R-Work) 0.2399
    R-Factor(R-Free) 0.2484
    Percent Reflections(Observed) 96.29
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    t_bond_d 0.01
    t_angle_deg 1.27
    t_omega_torsion 2.6
    t_other_torsion 24.18
     
    Coordinate Error
    Luzzati ESD(Observed) 0.92
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1804
    Nucleic Acid Atoms 0
    Heterogen Atoms 69
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS THROUGH XIA2
    Data Reduction (data scaling) AIMLESS THROUGH XIA2
    Structure Solution PHENIX.HYSS AND AUTOSHARP
    Structure Refinement BUSTER 2.11.2
     
    Software
    refinement BUSTER version: 2.11.2
    model building AUTOSHARP
    model building PHENIX.HYSS