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X-RAY DIFFRACTION
Materials and Methods page
4B3O
  •   Crystallization Hide
    Crystallization Experiments
    pH 5.2
    Details RT COMPLEX WAS MIXED WITH RESERVOIR SOLUTION CONTAINING 0.1M SODIUM CITRATE (PH5.2), 0.1M CACL2, 7.5% PEG400 (V/V). VAPOR DIFFUSION 4C.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 164.6 α = 90
    b = 164.6 β = 90
    c = 129.03 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-300)
    Type MARRESEARCH
    Details MIRRORS VERTICAL FOCUSING
    Collection Date 2010-07-10
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL - LIQUID NITROGEN COOLED
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength 1
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 3.3
    Resolution(Low) 30
    Number Reflections(Observed) 30196
    Percent Possible(Observed) 98.2
    B(Isotropic) From Wilson Plot 100.08
    Redundancy 4.2
     
    High Resolution Shell Details
    Resolution(High) 3.3
    Resolution(Low) 3.39
    Percent Possible(All) 99.9
    Mean I Over Sigma(Observed) 2.3
    R-Sym I(Observed) 0.72
    Redundancy 4.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.3
    Resolution(Low) 29.733
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 30184
    Number of Reflections(R-Free) 1515
    Percent Reflections(Observed) 98.36
    R-Factor(Observed) 0.2758
    R-Work 0.2748
    R-Free 0.2954
     
    Temperature Factor Modeling
    Mean Isotropic B Value 80.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3
    Shell Resolution(Low) 3.4064
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.3849
    R-Factor(R-Free) 0.4035
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4064
    Shell Resolution(Low) 3.5279
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.355
    R-Factor(R-Free) 0.4074
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5279
    Shell Resolution(Low) 3.669
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2633
    R-Factor(R-Work) 0.3454
    R-Factor(R-Free) 0.3855
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.669
    Shell Resolution(Low) 3.8356
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.3254
    R-Factor(R-Free) 0.3599
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8356
    Shell Resolution(Low) 4.0374
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.3175
    R-Factor(R-Free) 0.2979
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0374
    Shell Resolution(Low) 4.2896
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.3003
    R-Factor(R-Free) 0.2775
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2896
    Shell Resolution(Low) 4.6197
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2577
    R-Factor(R-Work) 0.2735
    R-Factor(R-Free) 0.3359
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6197
    Shell Resolution(Low) 5.0825
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.2637
    R-Factor(R-Free) 0.3116
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0825
    Shell Resolution(Low) 5.8132
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.2664
    R-Factor(R-Free) 0.286
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8132
    Shell Resolution(Low) 7.306
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.2695
    R-Factor(R-Free) 0.3057
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.306
    Shell Resolution(Low) 29.7343
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.2073
    R-Factor(R-Free) 0.2006
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.06
    f_dihedral_angle_d 13.894
    f_angle_d 0.875
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7543
    Nucleic Acid Atoms 947
    Heterogen Atoms 23
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building MOLREP