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X-RAY DIFFRACTION
Materials and Methods page
4B3B
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.2
    Details pH 6.2
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 40.23 α = 90
    b = 60.59 β = 90
    c = 87.52 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2009-05-14
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04
    Wavelength 0.972000
    Site DIAMOND
    Beamline I04
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 5.0
    Resolution(High) 1.19
    Resolution(Low) 26.29
    Number Reflections(Observed) 64405
    Percent Possible(Observed) 93.4
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 8.39
    Redundancy 4.6
     
    High Resolution Shell Details
    Resolution(High) 1.19
    Resolution(Low) 1.26
    Percent Possible(All) 90.4
    R Merge I(Observed) 0.24
    Mean I Over Sigma(Observed) 5.14
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.193
    Resolution(Low) 26.286
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 64403
    Number of Reflections(R-Free) 3251
    Percent Reflections(Observed) 93.44
    R-Factor(Observed) 0.1414
    R-Work 0.14
    R-Free 0.1671
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.2999
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.1044
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.4043
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1925
    Shell Resolution(Low) 1.2103
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2162
    R-Factor(R-Work) 0.1966
    R-Factor(R-Free) 0.2337
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2103
    Shell Resolution(Low) 1.2292
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2610
    R-Factor(R-Work) 0.1663
    R-Factor(R-Free) 0.1944
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2292
    Shell Resolution(Low) 1.2494
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.1357
    R-Factor(R-Free) 0.1646
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2494
    Shell Resolution(Low) 1.2709
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2702
    R-Factor(R-Work) 0.1233
    R-Factor(R-Free) 0.1542
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2709
    Shell Resolution(Low) 1.294
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.1245
    R-Factor(R-Free) 0.1646
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.294
    Shell Resolution(Low) 1.3189
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2735
    R-Factor(R-Work) 0.1227
    R-Factor(R-Free) 0.1556
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3189
    Shell Resolution(Low) 1.3458
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2727
    R-Factor(R-Work) 0.1221
    R-Factor(R-Free) 0.1578
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3458
    Shell Resolution(Low) 1.3751
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2725
    R-Factor(R-Work) 0.1168
    R-Factor(R-Free) 0.162
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3751
    Shell Resolution(Low) 1.4071
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.1133
    R-Factor(R-Free) 0.1353
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4071
    Shell Resolution(Low) 1.4423
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2747
    R-Factor(R-Work) 0.1165
    R-Factor(R-Free) 0.1657
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4423
    Shell Resolution(Low) 1.4813
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2738
    R-Factor(R-Work) 0.113
    R-Factor(R-Free) 0.1513
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4813
    Shell Resolution(Low) 1.5248
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.1056
    R-Factor(R-Free) 0.1442
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5248
    Shell Resolution(Low) 1.5741
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2733
    R-Factor(R-Work) 0.1068
    R-Factor(R-Free) 0.1343
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5741
    Shell Resolution(Low) 1.6303
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2744
    R-Factor(R-Work) 0.1069
    R-Factor(R-Free) 0.1471
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6303
    Shell Resolution(Low) 1.6956
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2753
    R-Factor(R-Work) 0.1148
    R-Factor(R-Free) 0.1476
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6956
    Shell Resolution(Low) 1.7727
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.123
    R-Factor(R-Free) 0.1677
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7727
    Shell Resolution(Low) 1.8662
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2725
    R-Factor(R-Work) 0.1324
    R-Factor(R-Free) 0.1491
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8662
    Shell Resolution(Low) 1.9831
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.1315
    R-Factor(R-Free) 0.2103
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9831
    Shell Resolution(Low) 2.1361
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.1385
    R-Factor(R-Free) 0.1495
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1361
    Shell Resolution(Low) 2.3509
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.1365
    R-Factor(R-Free) 0.1544
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3509
    Shell Resolution(Low) 2.6908
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.1558
    R-Factor(R-Free) 0.1739
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6908
    Shell Resolution(Low) 3.389
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.1596
    R-Factor(R-Free) 0.1896
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.389
    Shell Resolution(Low) 26.2924
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2364
    R-Factor(R-Work) 0.1843
    R-Factor(R-Free) 0.1815
    Percent Reflections(Observed) 77.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.074
    f_dihedral_angle_d 13.387
    f_angle_d 1.397
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1782
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 319
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution AMORE
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building AMORE