X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
pH 6.2
Details 8% PEG-1000, 100 MM NAK PHOSPHATE, PH 6.2

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 37.64 α = 90
b = 78.71 β = 117.91
c = 39.59 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC -- 2008-10-04
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 -- ESRF ID14-4

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.4 31.97 89.3 0.04 -- -- 2.8 -- 35882 -- 2.0 22.1
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.4 1.48 91.7 0.46 -- 2.27 2.6 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.4 31.969 -- 2.0 -- 35876 1863 89.56 -- 0.1913 0.1896 0.2231 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4001 1.438 -- 137 2648 0.2737 0.2968 -- 91.0
X Ray Diffraction 1.438 1.4803 -- 139 2700 0.2569 0.2974 -- 92.0
X Ray Diffraction 1.4803 1.5281 -- 155 2681 0.2389 0.2536 -- 92.0
X Ray Diffraction 1.5281 1.5827 -- 164 2672 0.2309 0.2814 -- 92.0
X Ray Diffraction 1.5827 1.646 -- 151 2671 0.2241 0.2546 -- 92.0
X Ray Diffraction 1.646 1.721 -- 138 2679 0.2141 0.2299 -- 92.0
X Ray Diffraction 1.721 1.8117 -- 142 2675 0.2007 0.2718 -- 91.0
X Ray Diffraction 1.8117 1.9252 -- 150 2614 0.19 0.2412 -- 91.0
X Ray Diffraction 1.9252 2.0738 -- 144 2625 0.1834 0.1986 -- 89.0
X Ray Diffraction 2.0738 2.2824 -- 142 2588 0.1813 0.2272 -- 89.0
X Ray Diffraction 2.2824 2.6126 -- 137 2540 0.1816 0.2223 -- 87.0
X Ray Diffraction 2.6126 3.291 -- 138 2539 0.1753 0.1903 -- 86.0
X Ray Diffraction 3.291 31.9769 -- 126 2381 0.1649 0.194 -- 80.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 1.6405
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 1.9553
Anisotropic B[2][2] 0.0176
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.6581
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.149
f_dihedral_angle_d 17.313
f_angle_d 1.508
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1714
Nucleic Acid Atoms 0
Heterogen Atoms 18
Solvent Atoms 298

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
AMORE Structure Solution
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement
AMORE model building