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X-RAY DIFFRACTION
Materials and Methods page
4B34
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.2
    Details 8% PEG-1000, 50 MM NAKPHOSPHATE, PH 6.2
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 37.62 α = 90
    b = 78.77 β = 118.06
    c = 39.63 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2008-12-10
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04
    Wavelength 0.972800
    Site DIAMOND
    Beamline I04
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.55
    Resolution(Low) 39.62
    Number Reflections(Observed) 29702
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.05
    B(Isotropic) From Wilson Plot 24.2
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 1.55
    Resolution(Low) 1.64
    Percent Possible(All) 98.8
    R Merge I(Observed) 0.58
    Mean I Over Sigma(Observed) 2.2
    Redundancy 3.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.55
    Resolution(Low) 33.22
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 29696
    Number of Reflections(R-Free) 1522
    Percent Reflections(Observed) 99.73
    R-Factor(Observed) 0.1886
    R-Work 0.1868
    R-Free 0.2236
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.4259
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 3.1165
    Anisotropic B[2][2] 0.4133
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.8392
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5496
    Shell Resolution(Low) 1.5996
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2534
    R-Factor(R-Work) 0.2491
    R-Factor(R-Free) 0.2854
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5996
    Shell Resolution(Low) 1.6568
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2556
    R-Factor(R-Work) 0.2476
    R-Factor(R-Free) 0.3019
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6568
    Shell Resolution(Low) 1.7232
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2579
    R-Factor(R-Work) 0.2352
    R-Factor(R-Free) 0.3084
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7232
    Shell Resolution(Low) 1.8016
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2556
    R-Factor(R-Work) 0.2202
    R-Factor(R-Free) 0.2837
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8016
    Shell Resolution(Low) 1.8965
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2542
    R-Factor(R-Work) 0.207
    R-Factor(R-Free) 0.249
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8965
    Shell Resolution(Low) 2.0154
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2561
    R-Factor(R-Work) 0.1944
    R-Factor(R-Free) 0.2456
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0154
    Shell Resolution(Low) 2.1709
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2534
    R-Factor(R-Work) 0.1881
    R-Factor(R-Free) 0.228
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1709
    Shell Resolution(Low) 2.3893
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.1835
    R-Factor(R-Free) 0.2326
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3893
    Shell Resolution(Low) 2.7349
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.1843
    R-Factor(R-Free) 0.2069
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7349
    Shell Resolution(Low) 3.4452
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.174
    R-Factor(R-Free) 0.2185
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4452
    Shell Resolution(Low) 33.2279
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.1576
    R-Factor(R-Free) 0.1723
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.151
    f_dihedral_angle_d 16.974
    f_angle_d 1.566
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1714
    Nucleic Acid Atoms 0
    Heterogen Atoms 15
    Solvent Atoms 273
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution AMORE
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building AMORE