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X-RAY DIFFRACTION
Materials and Methods page
4B33
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.2
    Details 8% PEG-1000, 100 MM NAK PHOSPHATE, PH 6.2
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 37.66 α = 90
    b = 78.71 β = 117.91
    c = 39.67 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2008-12-10
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04
    Wavelength 0.972800
    Site DIAMOND
    Beamline I04
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.5
    Resolution(Low) 35
    Number Reflections(Observed) 31815
    Percent Possible(Observed) 96.7
    R Merge I(Observed) 0.04
    B(Isotropic) From Wilson Plot 23.6
    Redundancy 3.6
     
    High Resolution Shell Details
    Resolution(High) 1.5
    Resolution(Low) 1.59
    Percent Possible(All) 95.2
    R Merge I(Observed) 0.4
    Mean I Over Sigma(Observed) 3.04
    Redundancy 3.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.499
    Resolution(Low) 33.073
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 31805
    Number of Reflections(R-Free) 1643
    Percent Reflections(Observed) 97.03
    R-Factor(Observed) 0.1901
    R-Work 0.1882
    R-Free 0.2269
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.9171
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 3.3533
    Anisotropic B[2][2] 0.1232
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.0404
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4991
    Shell Resolution(Low) 1.5432
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2456
    R-Factor(R-Work) 0.2653
    R-Factor(R-Free) 0.2926
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5432
    Shell Resolution(Low) 1.593
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2464
    R-Factor(R-Work) 0.2462
    R-Factor(R-Free) 0.2809
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.593
    Shell Resolution(Low) 1.6499
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2476
    R-Factor(R-Work) 0.2404
    R-Factor(R-Free) 0.3011
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6499
    Shell Resolution(Low) 1.716
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2507
    R-Factor(R-Work) 0.2311
    R-Factor(R-Free) 0.2636
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.716
    Shell Resolution(Low) 1.7941
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2502
    R-Factor(R-Work) 0.2155
    R-Factor(R-Free) 0.2986
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7941
    Shell Resolution(Low) 1.8887
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2506
    R-Factor(R-Work) 0.2039
    R-Factor(R-Free) 0.2386
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8887
    Shell Resolution(Low) 2.007
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2522
    R-Factor(R-Work) 0.1956
    R-Factor(R-Free) 0.2339
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.007
    Shell Resolution(Low) 2.1619
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2475
    R-Factor(R-Work) 0.1847
    R-Factor(R-Free) 0.239
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1619
    Shell Resolution(Low) 2.3794
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2564
    R-Factor(R-Work) 0.1932
    R-Factor(R-Free) 0.2361
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3794
    Shell Resolution(Low) 2.7236
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2543
    R-Factor(R-Work) 0.1864
    R-Factor(R-Free) 0.2151
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7236
    Shell Resolution(Low) 3.4309
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.1726
    R-Factor(R-Free) 0.1987
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4309
    Shell Resolution(Low) 33.0809
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2581
    R-Factor(R-Work) 0.1597
    R-Factor(R-Free) 0.1908
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.151
    f_dihedral_angle_d 18.14
    f_angle_d 1.568
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1714
    Nucleic Acid Atoms 0
    Heterogen Atoms 16
    Solvent Atoms 283
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution AMORE
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building AMORE