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X-RAY DIFFRACTION
Materials and Methods page
4B32
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.2
    Details 8% PEG-1000, 100 MM NAK PHOSPHATE, PH 6.2
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 37.69 α = 90
    b = 79.05 β = 117.88
    c = 39.62 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2008-12-10
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04
    Wavelength 0.972800
    Site DIAMOND
    Beamline I04
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.5
    Resolution(Low) 39.53
    Number Reflections(Observed) 32695
    Percent Possible(Observed) 99.2
    R Merge I(Observed) 0.04
    B(Isotropic) From Wilson Plot 23.082
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 1.5
    Resolution(Low) 1.59
    Percent Possible(All) 98.8
    R Merge I(Observed) 0.38
    Mean I Over Sigma(Observed) 3.4
    Redundancy 3.65
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.5
    Resolution(Low) 33.064
    Cut-off Sigma(F) 2.01
    Number of Reflections(Observed) 32683
    Number of Reflections(R-Free) 1686
    Percent Reflections(Observed) 99.57
    R-Factor(Observed) 0.1911
    R-Work 0.1891
    R-Free 0.2276
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.6366
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 2.7944
    Anisotropic B[2][2] 0.0232
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.6599
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5002
    Shell Resolution(Low) 1.5444
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2531
    R-Factor(R-Work) 0.2519
    R-Factor(R-Free) 0.2776
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5444
    Shell Resolution(Low) 1.5942
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2579
    R-Factor(R-Work) 0.2317
    R-Factor(R-Free) 0.294
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5942
    Shell Resolution(Low) 1.6512
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.2351
    R-Factor(R-Free) 0.2569
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6512
    Shell Resolution(Low) 1.7173
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.2187
    R-Factor(R-Free) 0.2805
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7173
    Shell Resolution(Low) 1.7955
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.208
    R-Factor(R-Free) 0.2709
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7955
    Shell Resolution(Low) 1.8901
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.2006
    R-Factor(R-Free) 0.2403
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8901
    Shell Resolution(Low) 2.0085
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.1893
    R-Factor(R-Free) 0.2327
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0085
    Shell Resolution(Low) 2.1636
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2535
    R-Factor(R-Work) 0.1869
    R-Factor(R-Free) 0.2188
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1636
    Shell Resolution(Low) 2.3813
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.1806
    R-Factor(R-Free) 0.2198
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3813
    Shell Resolution(Low) 2.7257
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.1849
    R-Factor(R-Free) 0.1927
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7257
    Shell Resolution(Low) 3.4335
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.2262
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4335
    Shell Resolution(Low) 33.0724
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.1653
    R-Factor(R-Free) 0.1988
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.148
    f_dihedral_angle_d 17.805
    f_angle_d 1.577
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1714
    Nucleic Acid Atoms 0
    Heterogen Atoms 16
    Solvent Atoms 305
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution AMORE
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building AMORE