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X-RAY DIFFRACTION
Materials and Methods page
4B2I
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.2
    Details 10-15% PEG-1000, 50 MM NAKPHOSPHATE, PH 6.2
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 37.62 α = 90
    b = 78.77 β = 118.06
    c = 39.63 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 210)
    Type ADSC
    Collection Date 2008-10-04
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength 0.9795
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.3
    Resolution(Low) 39.38
    Number Reflections(Observed) 49540
    Percent Possible(Observed) 99.0
    R Merge I(Observed) 0.04
    B(Isotropic) From Wilson Plot 20.2
    Redundancy 3.6
     
    High Resolution Shell Details
    Resolution(High) 1.3
    Resolution(Low) 1.38
    Percent Possible(All) 99.0
    R Merge I(Observed) 0.49
    Mean I Over Sigma(Observed) 2.6
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.3
    Resolution(Low) 33.064
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 49527
    Number of Reflections(R-Free) 2552
    Percent Reflections(Observed) 99.09
    R-Factor(Observed) 0.2005
    R-Work 0.1993
    R-Free 0.2232
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.4549
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 2.3241
    Anisotropic B[2][2] 0.651
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.1059
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3001
    Shell Resolution(Low) 1.3251
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.2861
    R-Factor(R-Free) 0.2744
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3251
    Shell Resolution(Low) 1.3522
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 2555
    R-Factor(R-Work) 0.273
    R-Factor(R-Free) 0.3
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3522
    Shell Resolution(Low) 1.3816
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.2699
    R-Factor(R-Free) 0.2823
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3816
    Shell Resolution(Low) 1.4137
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.2556
    R-Factor(R-Free) 0.2772
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4137
    Shell Resolution(Low) 1.449
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.2509
    R-Factor(R-Free) 0.2512
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.449
    Shell Resolution(Low) 1.4882
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.2369
    R-Factor(R-Free) 0.2571
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4882
    Shell Resolution(Low) 1.532
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2616
    R-Factor(R-Work) 0.2346
    R-Factor(R-Free) 0.2538
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.532
    Shell Resolution(Low) 1.5815
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.2256
    R-Factor(R-Free) 0.2323
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5815
    Shell Resolution(Low) 1.638
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.2217
    R-Factor(R-Free) 0.2662
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.638
    Shell Resolution(Low) 1.7036
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.221
    R-Factor(R-Free) 0.2087
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7036
    Shell Resolution(Low) 1.7811
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2592
    R-Factor(R-Work) 0.2021
    R-Factor(R-Free) 0.283
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7811
    Shell Resolution(Low) 1.875
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2651
    R-Factor(R-Work) 0.2039
    R-Factor(R-Free) 0.2201
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.875
    Shell Resolution(Low) 1.9925
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.196
    R-Factor(R-Free) 0.2485
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9925
    Shell Resolution(Low) 2.1463
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.1825
    R-Factor(R-Free) 0.2194
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1463
    Shell Resolution(Low) 2.3622
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.182
    R-Factor(R-Free) 0.2142
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3622
    Shell Resolution(Low) 2.7039
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.2021
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7039
    Shell Resolution(Low) 3.406
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.1801
    R-Factor(R-Free) 0.2014
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.406
    Shell Resolution(Low) 33.0748
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2465
    R-Factor(R-Work) 0.1775
    R-Factor(R-Free) 0.1958
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.153
    f_dihedral_angle_d 17.699
    f_angle_d 1.549
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1714
    Nucleic Acid Atoms 0
    Heterogen Atoms 14
    Solvent Atoms 344
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution AMORE
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building AMORE