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X-RAY DIFFRACTION
Materials and Methods page
4B0P
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details 2.1 M AMMONIUM SULFATE, 0.1 M MES BUFFER PH 6.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 154.23 α = 90
    b = 154.23 β = 90
    c = 133.86 γ = 90
     
    Space Group
    Space Group Name:    I 4 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD (QUANTUM Q315R)
    Type ADSC
    Collection Date 2011-09-26
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength 1.00407
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.5
    Resolution(Low) 30.88
    Number Reflections(Observed) 27807
    Percent Possible(Observed) 98.6
    R Merge I(Observed) 0.01
    B(Isotropic) From Wilson Plot 45.8
    Redundancy 3.2
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.6
    Percent Possible(All) 99.2
    R Merge I(Observed) 0.06
    Mean I Over Sigma(Observed) 3.58
    Redundancy 3.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.5
    Resolution(Low) 30.878
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 27798
    Number of Reflections(R-Free) 1112
    Percent Reflections(Observed) 98.7
    R-Factor(Observed) 0.1663
    R-Work 0.1644
    R-Free 0.212
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.6137
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3306
    R-Factor(R-Work) 0.1969
    R-Factor(R-Free) 0.2461
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6137
    Shell Resolution(Low) 2.7515
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3313
    R-Factor(R-Work) 0.2071
    R-Factor(R-Free) 0.2914
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7515
    Shell Resolution(Low) 2.9237
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3322
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2422
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9237
    Shell Resolution(Low) 3.1493
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3331
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.2779
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1493
    Shell Resolution(Low) 3.4658
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3353
    R-Factor(R-Work) 0.1753
    R-Factor(R-Free) 0.261
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4658
    Shell Resolution(Low) 3.9664
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3324
    R-Factor(R-Work) 0.1471
    R-Factor(R-Free) 0.2062
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9664
    Shell Resolution(Low) 4.9939
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3345
    R-Factor(R-Work) 0.1283
    R-Factor(R-Free) 0.1378
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9939
    Shell Resolution(Low) 30.8808
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3392
    R-Factor(R-Work) 0.1684
    R-Factor(R-Free) 0.2111
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.091
    f_dihedral_angle_d 21.089
    f_angle_d 1.259
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4207
    Nucleic Acid Atoms 0
    Heterogen Atoms 170
    Solvent Atoms 188
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)