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X-RAY DIFFRACTION
Materials and Methods page
4B0O
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details 2.1 M AMMONIUM SULFATE, 0.1 M MES BUFFER PH 6.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 155.51 α = 90
    b = 155.51 β = 90
    c = 128.46 γ = 90
     
    Space Group
    Space Group Name:    I 4 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Collection Date 2011-09-26
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength 1.00407
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.35
    Resolution(Low) 48.1
    Number Reflections(Observed) 32534
    Percent Possible(Observed) 98.6
    R Merge I(Observed) 0.09
    B(Isotropic) From Wilson Plot 37.48
    Redundancy 5.6
     
    High Resolution Shell Details
    Resolution(High) 2.35
    Resolution(Low) 2.45
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.38
    Mean I Over Sigma(Observed) 5.1
    Redundancy 5.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.35
    Resolution(Low) 30.827
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 32524
    Number of Reflections(R-Free) 1138
    Percent Reflections(Observed) 98.64
    R-Factor(Observed) 0.1698
    R-Work 0.1685
    R-Free 0.2044
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.0181
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.0181
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.0363
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.35
    Shell Resolution(Low) 2.4569
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3894
    R-Factor(R-Work) 0.2195
    R-Factor(R-Free) 0.2969
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4569
    Shell Resolution(Low) 2.5864
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3918
    R-Factor(R-Work) 0.2094
    R-Factor(R-Free) 0.2513
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5864
    Shell Resolution(Low) 2.7483
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3896
    R-Factor(R-Work) 0.1976
    R-Factor(R-Free) 0.2825
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7483
    Shell Resolution(Low) 2.9604
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3941
    R-Factor(R-Work) 0.1892
    R-Factor(R-Free) 0.2392
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9604
    Shell Resolution(Low) 3.258
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3917
    R-Factor(R-Work) 0.1754
    R-Factor(R-Free) 0.2271
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.258
    Shell Resolution(Low) 3.7288
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3907
    R-Factor(R-Work) 0.1579
    R-Factor(R-Free) 0.2068
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7288
    Shell Resolution(Low) 4.6952
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3913
    R-Factor(R-Work) 0.1333
    R-Factor(R-Free) 0.154
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6952
    Shell Resolution(Low) 30.8298
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 4000
    R-Factor(R-Work) 0.1694
    R-Factor(R-Free) 0.1756
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.077
    f_dihedral_angle_d 19.448
    f_angle_d 1.079
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4206
    Nucleic Acid Atoms 0
    Heterogen Atoms 168
    Solvent Atoms 295
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSALE
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7.3_928)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.7.3_928)