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X-RAY DIFFRACTION
Materials and Methods page
4B0F
  •   Crystallization Hide
    Crystallization Experiments
    Details 46.5 % (V/V) PEG 400, 5 % (V/V) MPD, 0.1 M TRIS PH. 7.3 WITH 13.7 MG/ML C4BP
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.85 α = 90
    b = 73.85 β = 90
    c = 204.29 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
    Collection Date 2012-01-12
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength 0.980
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.8
    Resolution(Low) 20
    Number Reflections(Observed) 26577
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 71.53
    Redundancy 15.5
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.9
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.64
    Mean I Over Sigma(Observed) 4.7
    Redundancy 15.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.8
    Resolution(Low) 46.496
    Cut-off Sigma(F) 1.54
    Number of Reflections(Observed) 26577
    Number of Reflections(R-Free) 1326
    Percent Reflections(Observed) 99.97
    R-Factor(Observed) 0.2138
    R-Work 0.2121
    R-Free 0.2477
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.6645
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.6645
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.3291
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8
    Shell Resolution(Low) 2.9121
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2797
    R-Factor(R-Work) 0.3161
    R-Factor(R-Free) 0.3473
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9121
    Shell Resolution(Low) 3.0446
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2799
    R-Factor(R-Work) 0.3014
    R-Factor(R-Free) 0.2887
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0446
    Shell Resolution(Low) 3.2051
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2829
    R-Factor(R-Work) 0.2427
    R-Factor(R-Free) 0.2892
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2051
    Shell Resolution(Low) 3.4059
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2789
    R-Factor(R-Work) 0.2437
    R-Factor(R-Free) 0.2729
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4059
    Shell Resolution(Low) 3.6688
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2812
    R-Factor(R-Work) 0.2134
    R-Factor(R-Free) 0.2174
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6688
    Shell Resolution(Low) 4.0378
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2811
    R-Factor(R-Work) 0.2005
    R-Factor(R-Free) 0.2317
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0378
    Shell Resolution(Low) 4.6216
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2795
    R-Factor(R-Work) 0.1659
    R-Factor(R-Free) 0.2086
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6216
    Shell Resolution(Low) 5.8209
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2809
    R-Factor(R-Work) 0.2036
    R-Factor(R-Free) 0.2267
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8209
    Shell Resolution(Low) 46.5025
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2810
    R-Factor(R-Work) 0.2087
    R-Factor(R-Free) 0.2743
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.068
    f_dihedral_angle_d 17.106
    f_angle_d 1.017
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2935
    Nucleic Acid Atoms 0
    Heterogen Atoms 2
    Solvent Atoms 4
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHENIX.AUTOSOL
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHENIX.AUTOSOL