X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
pH 9.4
Details 0.1 M BICINE PH 8.0-9.4, 6-10% PEG 8000

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 73.97 α = 90
b = 127.45 β = 90
c = 144.08 γ = 90
Symmetry
Space Group P 2 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD (QUANTUM 315R) ADSC -- 2009-02-12
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID23-1 -- ESRF ID23-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.67 73.97 100.0 0.13 -- -- 19.7 -- 39626 -- 0.0 45.86
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.67 2.81 99.8 0.66 -- 4.6 17.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.67 65.8 -- 1.35 -- 39564 1986 99.86 -- 0.1972 0.1952 0.234 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6663 2.7329 -- 155 2587 0.2429 0.2922 -- 99.0
X Ray Diffraction 2.7329 2.8068 -- 139 2622 0.2203 0.2942 -- 100.0
X Ray Diffraction 2.8068 2.8894 -- 149 2657 0.2208 0.306 -- 100.0
X Ray Diffraction 2.8894 2.9827 -- 117 2674 0.2142 0.2781 -- 100.0
X Ray Diffraction 2.9827 3.0893 -- 132 2662 0.2158 0.274 -- 100.0
X Ray Diffraction 3.0893 3.213 -- 156 2655 0.2176 0.2915 -- 100.0
X Ray Diffraction 3.213 3.3592 -- 124 2685 0.2204 0.2964 -- 100.0
X Ray Diffraction 3.3592 3.5363 -- 118 2686 0.2036 0.2644 -- 100.0
X Ray Diffraction 3.5363 3.7578 -- 142 2664 0.1926 0.2637 -- 100.0
X Ray Diffraction 3.7578 4.0479 -- 139 2687 0.1852 0.1868 -- 100.0
X Ray Diffraction 4.0479 4.4552 -- 158 2674 0.1622 0.1961 -- 100.0
X Ray Diffraction 4.4552 5.0997 -- 141 2716 0.1529 0.1831 -- 100.0
X Ray Diffraction 5.0997 6.4242 -- 137 2772 0.2009 0.2251 -- 100.0
X Ray Diffraction 6.4242 65.8234 -- 179 2837 0.2056 0.2127 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 56.5
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.002
f_chiral_restr 0.036
f_dihedral_angle_d 12.311
f_angle_d 0.573
f_bond_d 0.002
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6615
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 110

Software

Computing
Computing Package Purpose
MOSFLM Data Reduction (intensity integration)
SCALA Data Reduction (data scaling)
PHENIX Structure Solution
PHENIX (PHENIX.REFINE: DEV_1078) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE: DEV_1078) refinement
PHENIX model building