POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4AXS
  •   Crystallization Hide
    Crystallization Experiments
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 51.8 α = 90
    b = 51.8 β = 90
    c = 174.16 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-2
    Wavelength 0.8726
    Site ESRF
    Beamline ID23-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.38
    Resolution(Low) 44.86
    Number Reflections(Observed) 11222
    Percent Possible(Observed) 97.7
    R Merge I(Observed) 0.07
    B(Isotropic) From Wilson Plot 45.29
    Redundancy 4.8
     
    High Resolution Shell Details
    Resolution(High) 2.38
    Resolution(Low) 2.51
    Percent Possible(All) 92.2
    R Merge I(Observed) 0.39
    Mean I Over Sigma(Observed) 2.5
    Redundancy 4.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.5
    Resolution(Low) 44.86
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 9818
    Number of Reflections(R-Free) 465
    Percent Reflections(Observed) 98.17
    R-Factor(Observed) 0.2332
    R-Work 0.2306
    R-Free 0.2872
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 11.9406
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 11.9406
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -23.8811
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5001
    Shell Resolution(Low) 2.8619
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2998
    R-Factor(R-Work) 0.2711
    R-Factor(R-Free) 0.3452
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8619
    Shell Resolution(Low) 3.6054
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 3067
    R-Factor(R-Work) 0.2229
    R-Factor(R-Free) 0.2997
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6054
    Shell Resolution(Low) 44.8673
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 3288
    R-Factor(R-Work) 0.2211
    R-Factor(R-Free) 0.2625
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.077
    f_dihedral_angle_d 20.881
    f_angle_d 1.109
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2155
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 33
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building MOLREP