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X-RAY DIFFRACTION
Materials and Methods page
4AW1
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Details 1.2 M NA CITRATE, 0.1 M HEPES PH 7.5, 0.01 M DTT
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 145.65 α = 90
    b = 42.67 β = 98.52
    c = 46.33 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Details MIRRORS
    Collection Date 2010-12-03
     
    Diffraction Radiation
    Monochromator SI-111 CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength 0.91841
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.68
    Resolution(Low) 36
    Number Reflections(Observed) 32322
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.05
    B(Isotropic) From Wilson Plot 20.17
    Redundancy 4.1
     
    High Resolution Shell Details
    Resolution(High) 1.68
    Resolution(Low) 1.78
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.67
    Mean I Over Sigma(Observed) 2.0
    Redundancy 4.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.68
    Resolution(Low) 36.301
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 32317
    Number of Reflections(R-Free) 1617
    Percent Reflections(Observed) 99.77
    R-Factor(Observed) 0.1652
    R-Work 0.1641
    R-Free 0.1858
     
    Temperature Factor Modeling
    Mean Isotropic B Value 26.9
    Anisotropic B[1][1] 2.4079
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -6.5737
    Anisotropic B[2][2] -1.1075
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.3004
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6799
    Shell Resolution(Low) 1.7294
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.2683
    R-Factor(R-Free) 0.3126
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7294
    Shell Resolution(Low) 1.7852
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2526
    R-Factor(R-Work) 0.2281
    R-Factor(R-Free) 0.2388
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7852
    Shell Resolution(Low) 1.849
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2555
    R-Factor(R-Work) 0.2069
    R-Factor(R-Free) 0.2205
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.849
    Shell Resolution(Low) 1.923
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2523
    R-Factor(R-Work) 0.1927
    R-Factor(R-Free) 0.2181
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.923
    Shell Resolution(Low) 2.0105
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2546
    R-Factor(R-Work) 0.1665
    R-Factor(R-Free) 0.2301
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0105
    Shell Resolution(Low) 2.1165
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2556
    R-Factor(R-Work) 0.1514
    R-Factor(R-Free) 0.1621
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1165
    Shell Resolution(Low) 2.2491
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2550
    R-Factor(R-Work) 0.1429
    R-Factor(R-Free) 0.1761
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2491
    Shell Resolution(Low) 2.4227
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2559
    R-Factor(R-Work) 0.1475
    R-Factor(R-Free) 0.1942
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4227
    Shell Resolution(Low) 2.6664
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2540
    R-Factor(R-Work) 0.157
    R-Factor(R-Free) 0.2108
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6664
    Shell Resolution(Low) 3.0521
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.1549
    R-Factor(R-Free) 0.1811
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0521
    Shell Resolution(Low) 3.8447
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2583
    R-Factor(R-Work) 0.1489
    R-Factor(R-Free) 0.169
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8447
    Shell Resolution(Low) 36.3099
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1666
    R-Factor(R-Free) 0.1612
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.072
    f_dihedral_angle_d 13.691
    f_angle_d 1.223
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2234
    Nucleic Acid Atoms 0
    Heterogen Atoms 72
    Solvent Atoms 145
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER