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X-RAY DIFFRACTION
Materials and Methods page
4AW0
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Details 1.2 M NA CITRATE, 0.1 M HEPES PH 7.5, 0.01 M DTT
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 148.27 α = 90
    b = 44.01 β = 101.57
    c = 47.39 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Details MIRRORS
    Collection Date 2011-07-30
     
    Diffraction Radiation
    Monochromator SI-111 CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength 0.91841
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.1
    Resolution(High) 1.43
    Resolution(Low) 46
    Number Reflections(Observed) 53029
    Percent Possible(Observed) 95.4
    R Merge I(Observed) 0.03
    B(Isotropic) From Wilson Plot 15.65
    Redundancy 2.4
     
    High Resolution Shell Details
    Resolution(High) 1.43
    Resolution(Low) 1.53
    Percent Possible(All) 94.2
    R Merge I(Observed) 0.5
    Mean I Over Sigma(Observed) 2.1
    Redundancy 2.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.43
    Resolution(Low) 46.427
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 53019
    Number of Reflections(R-Free) 2651
    Percent Reflections(Observed) 95.4
    R-Factor(Observed) 0.1714
    R-Work 0.1704
    R-Free 0.1883
     
    Temperature Factor Modeling
    Mean Isotropic B Value 21.8
    Anisotropic B[1][1] -0.3038
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.0753
    Anisotropic B[2][2] 1.6758
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.372
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4299
    Shell Resolution(Low) 1.4559
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.2841
    R-Factor(R-Free) 0.2908
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4559
    Shell Resolution(Low) 1.4839
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2585
    R-Factor(R-Work) 0.261
    R-Factor(R-Free) 0.2727
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4839
    Shell Resolution(Low) 1.5142
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.2371
    R-Factor(R-Free) 0.244
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5142
    Shell Resolution(Low) 1.5471
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2520
    R-Factor(R-Work) 0.226
    R-Factor(R-Free) 0.2295
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5471
    Shell Resolution(Low) 1.5831
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.2025
    R-Factor(R-Free) 0.2336
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5831
    Shell Resolution(Low) 1.6227
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1931
    R-Factor(R-Free) 0.1961
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6227
    Shell Resolution(Low) 1.6666
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.1861
    R-Factor(R-Free) 0.2413
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6666
    Shell Resolution(Low) 1.7156
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1801
    R-Factor(R-Free) 0.2321
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7156
    Shell Resolution(Low) 1.771
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.2048
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.771
    Shell Resolution(Low) 1.8343
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2741
    R-Factor(R-Work) 0.1723
    R-Factor(R-Free) 0.1826
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8343
    Shell Resolution(Low) 1.9077
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.169
    R-Factor(R-Free) 0.2156
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9077
    Shell Resolution(Low) 1.9945
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2553
    R-Factor(R-Work) 0.1615
    R-Factor(R-Free) 0.1832
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9945
    Shell Resolution(Low) 2.0997
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.1517
    R-Factor(R-Free) 0.1697
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0997
    Shell Resolution(Low) 2.2312
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.1498
    R-Factor(R-Free) 0.1844
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2312
    Shell Resolution(Low) 2.4035
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.1535
    R-Factor(R-Free) 0.1741
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4035
    Shell Resolution(Low) 2.6454
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2736
    R-Factor(R-Work) 0.1643
    R-Factor(R-Free) 0.2012
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6454
    Shell Resolution(Low) 3.0281
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.1646
    R-Factor(R-Free) 0.1749
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0281
    Shell Resolution(Low) 3.8148
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.1547
    R-Factor(R-Free) 0.1656
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8148
    Shell Resolution(Low) 46.4519
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.1736
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.088
    f_dihedral_angle_d 15.352
    f_angle_d 1.445
    f_bond_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2251
    Nucleic Acid Atoms 0
    Heterogen Atoms 69
    Solvent Atoms 227
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER