POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4AUI
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details pH 7
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 114.05 α = 90
    b = 111.47 β = 102.07
    c = 88.34 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength 1
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.7
    Resolution(High) 3.2
    Resolution(Low) 38
    Number Reflections(Observed) 14044
    Percent Possible(Observed) 98.0
    R Merge I(Observed) 0.23
    B(Isotropic) From Wilson Plot 80.38
    Redundancy 3.9
     
    High Resolution Shell Details
    Resolution(High) 3.2
    Resolution(Low) 3.4
    Percent Possible(All) 95.4
    R Merge I(Observed) 0.92
    Mean I Over Sigma(Observed) 1.7
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.2
    Resolution(Low) 38.05
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 14044
    Number of Reflections(R-Free) 700
    Percent Reflections(Observed) 78.39
    R-Factor(Observed) 0.2236
    R-Work 0.2212
    R-Free 0.2679
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.6253
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -4.3982
    Anisotropic B[2][2] -0.0794
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.546
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2002
    Shell Resolution(Low) 3.4472
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.3283
    R-Factor(R-Free) 0.4267
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4472
    Shell Resolution(Low) 3.7938
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.2543
    R-Factor(R-Free) 0.3018
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7938
    Shell Resolution(Low) 4.3421
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.1929
    R-Factor(R-Free) 0.2628
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3421
    Shell Resolution(Low) 5.468
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2663
    R-Factor(R-Work) 0.1757
    R-Factor(R-Free) 0.2422
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.468
    Shell Resolution(Low) 38.053
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.2289
    R-Factor(R-Free) 0.2286
    Percent Reflections(Observed) 77.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.121
    f_dihedral_angle_d 20.644
    f_angle_d 1.938
    f_bond_d 0.022
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7205
    Nucleic Acid Atoms 0
    Heterogen Atoms 124
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building MOLREP