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X-RAY DIFFRACTION
Materials and Methods page
4ATK
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 151.42 α = 90
    b = 45.09 β = 136.47
    c = 110.66 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Collection Date 2009-02-16
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength 0.9535
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.5
    Resolution(High) 2.95
    Resolution(Low) 55
    Number Reflections(Observed) 10446
    Percent Possible(Observed) 94.7
    R Merge I(Observed) 0.07
    B(Isotropic) From Wilson Plot 69.0
    Redundancy 4.7
     
    High Resolution Shell Details
    Resolution(High) 2.95
    Resolution(Low) 3.11
    Percent Possible(All) 94.4
    R Merge I(Observed) 0.56
    Mean I Over Sigma(Observed) 2.3
    Redundancy 4.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.95
    Resolution(Low) 26.072
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 10312
    Number of Reflections(R-Free) 521
    Percent Reflections(Observed) 92.69
    R-Factor(Observed) 0.2551
    R-Work 0.2534
    R-Free 0.2736
     
    Temperature Factor Modeling
    Mean Isotropic B Value 75.2
    Anisotropic B[1][1] -0.2536
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.0151
    Anisotropic B[2][2] -3.9941
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.2476
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9573
    Shell Resolution(Low) 3.252
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 2341
    R-Factor(R-Work) 0.5029
    R-Factor(R-Free) 0.43
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.252
    Shell Resolution(Low) 3.7158
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2495
    R-Factor(R-Work) 0.2603
    R-Factor(R-Free) 0.2779
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7158
    Shell Resolution(Low) 4.6565
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2505
    R-Factor(R-Work) 0.2226
    R-Factor(R-Free) 0.2653
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6565
    Shell Resolution(Low) 14.6621
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2396
    R-Factor(R-Work) 0.2119
    R-Factor(R-Free) 0.2544
    Percent Reflections(Observed) 85.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.078
    f_dihedral_angle_d 24.49
    f_angle_d 1.4
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1003
    Nucleic Acid Atoms 650
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER