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X-RAY DIFFRACTION
Materials and Methods page
4ATI
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 118.99 α = 90
    b = 104.26 β = 112.15
    c = 44.9 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Collection Date 2009-02-16
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength 0.9535
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.5
    Resolution(High) 2.6
    Resolution(Low) 55
    Number Reflections(Observed) 15081
    Percent Possible(Observed) 96.6
    R Merge I(Observed) 0.05
    B(Isotropic) From Wilson Plot 75.8
    Redundancy 3.5
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.74
    Percent Possible(All) 96.6
    R Merge I(Observed) 0.39
    Mean I Over Sigma(Observed) 3.1
    Redundancy 3.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 37.869
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 15081
    Number of Reflections(R-Free) 759
    Percent Reflections(Observed) 96.39
    R-Factor(Observed) 0.2302
    R-Work 0.2274
    R-Free 0.2737
     
    Temperature Factor Modeling
    Mean Isotropic B Value 79.3
    Anisotropic B[1][1] 11.2707
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 2.6111
    Anisotropic B[2][2] -23.8887
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 12.618
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6003
    Shell Resolution(Low) 2.7994
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2811
    R-Factor(R-Work) 0.5679
    R-Factor(R-Free) 0.614
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7994
    Shell Resolution(Low) 3.078
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2928
    R-Factor(R-Work) 0.3886
    R-Factor(R-Free) 0.4422
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.078
    Shell Resolution(Low) 3.5163
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2929
    R-Factor(R-Work) 0.2342
    R-Factor(R-Free) 0.2838
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5163
    Shell Resolution(Low) 4.4039
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2988
    R-Factor(R-Work) 0.1847
    R-Factor(R-Free) 0.2074
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4039
    Shell Resolution(Low) 13.3938
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1794
    R-Factor(R-Free) 0.2396
    Percent Reflections(Observed) 84.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.073
    f_dihedral_angle_d 23.465
    f_angle_d 1.361
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1064
    Nucleic Acid Atoms 650
    Heterogen Atoms 0
    Solvent Atoms 14
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER