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X-RAY DIFFRACTION
Materials and Methods page
4ARB
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details 0.1 M HEPES, 30 % (V/V) POLYETHELENEGLYCOLEMONOMETHYLETHER, pH 7
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.93 α = 90
    b = 111.78 β = 90
    c = 227.07 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
    Details MIRRORS
    Collection Date 2011-01-29
     
    Diffraction Radiation
    Monochromator RH-COATED SI MIRROR, BENT FOR VERTICAL COLLIMATION
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-3
    Wavelength 1.039
    Site MAX II
    Beamline I911-3
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 2.25
    Resolution(Low) 29.1
    Number Reflections(Observed) 96077
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.07
    B(Isotropic) From Wilson Plot 41.84
    Redundancy 5.7
     
    High Resolution Shell Details
    Resolution(High) 2.25
    Resolution(Low) 2.37
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.48
    Mean I Over Sigma(Observed) 3.7
    Redundancy 5.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.25
    Resolution(Low) 28.806
    Cut-off Sigma(F) 1.33
    Number of Reflections(Observed) 95904
    Number of Reflections(R-Free) 1893
    Percent Reflections(Observed) 99.89
    R-Factor(Observed) 0.1722
    R-Work 0.1715
    R-Free 0.2091
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.3384
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 2.5156
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.8539
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.25
    Shell Resolution(Low) 2.3063
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 6602
    R-Factor(R-Work) 0.2599
    R-Factor(R-Free) 0.3242
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3063
    Shell Resolution(Low) 2.3686
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 6643
    R-Factor(R-Work) 0.2439
    R-Factor(R-Free) 0.2971
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3686
    Shell Resolution(Low) 2.4382
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 6642
    R-Factor(R-Work) 0.2287
    R-Factor(R-Free) 0.277
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4382
    Shell Resolution(Low) 2.5169
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 6652
    R-Factor(R-Work) 0.2191
    R-Factor(R-Free) 0.2571
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5169
    Shell Resolution(Low) 2.6068
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 6676
    R-Factor(R-Work) 0.2015
    R-Factor(R-Free) 0.2633
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6068
    Shell Resolution(Low) 2.7111
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 6664
    R-Factor(R-Work) 0.2006
    R-Factor(R-Free) 0.2734
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7111
    Shell Resolution(Low) 2.8344
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 6650
    R-Factor(R-Work) 0.2025
    R-Factor(R-Free) 0.237
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8344
    Shell Resolution(Low) 2.9837
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 6704
    R-Factor(R-Work) 0.1808
    R-Factor(R-Free) 0.2343
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9837
    Shell Resolution(Low) 3.1704
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 6685
    R-Factor(R-Work) 0.1752
    R-Factor(R-Free) 0.2106
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1704
    Shell Resolution(Low) 3.4148
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 6729
    R-Factor(R-Work) 0.1804
    R-Factor(R-Free) 0.2124
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4148
    Shell Resolution(Low) 3.7578
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 6713
    R-Factor(R-Work) 0.1627
    R-Factor(R-Free) 0.197
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7578
    Shell Resolution(Low) 4.3
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 6779
    R-Factor(R-Work) 0.1354
    R-Factor(R-Free) 0.177
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3
    Shell Resolution(Low) 5.4117
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 6819
    R-Factor(R-Work) 0.1288
    R-Factor(R-Free) 0.1495
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4117
    Shell Resolution(Low) 28.8081
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 7053
    R-Factor(R-Work) 0.1742
    R-Factor(R-Free) 0.2016
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.078
    f_dihedral_angle_d 16.664
    f_angle_d 1.09
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8295
    Nucleic Acid Atoms 0
    Heterogen Atoms 153
    Solvent Atoms 989
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution REFMAC
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building REFMAC