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X-RAY DIFFRACTION
Materials and Methods page
4ARA
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details 0.1 M HEPES, 30 % (V/V) POLYETHELENEGLYCOLEMONOMETHYLETHER, PH 7
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.76 α = 90
    b = 112.01 β = 90
    c = 227.34 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
    Details MIRRORS
    Collection Date 2012-02-14
     
    Diffraction Radiation
    Monochromator RH-COATED SI MIRROR, BENT FOR VERTICAL COLLIMATION
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-5
    Wavelength 1.0
    Site MAX II
    Beamline I911-5
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 2.5
    Resolution(Low) 28.98
    Number Reflections(Observed) 70472
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 39.74
    Redundancy 5.4
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.64
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.56
    Mean I Over Sigma(Observed) 4.0
    Redundancy 5.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.5
    Resolution(Low) 28.855
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 70252
    Number of Reflections(R-Free) 1416
    Percent Reflections(Observed) 99.79
    R-Factor(Observed) 0.1834
    R-Work 0.1826
    R-Free 0.222
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 10.8219
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 12.843
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -23.6649
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.5893
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 6772
    R-Factor(R-Work) 0.2516
    R-Factor(R-Free) 0.3072
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5893
    Shell Resolution(Low) 2.6929
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 6773
    R-Factor(R-Work) 0.2283
    R-Factor(R-Free) 0.2913
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6929
    Shell Resolution(Low) 2.8154
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 6819
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.2521
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8154
    Shell Resolution(Low) 2.9637
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 6822
    R-Factor(R-Work) 0.2017
    R-Factor(R-Free) 0.2763
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9637
    Shell Resolution(Low) 3.1492
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 6812
    R-Factor(R-Work) 0.2038
    R-Factor(R-Free) 0.2251
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1492
    Shell Resolution(Low) 3.392
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 6883
    R-Factor(R-Work) 0.2051
    R-Factor(R-Free) 0.2611
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.392
    Shell Resolution(Low) 3.7327
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 6867
    R-Factor(R-Work) 0.1836
    R-Factor(R-Free) 0.2211
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7327
    Shell Resolution(Low) 4.2713
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6914
    R-Factor(R-Work) 0.1496
    R-Factor(R-Free) 0.1868
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2713
    Shell Resolution(Low) 5.3757
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 6985
    R-Factor(R-Work) 0.1405
    R-Factor(R-Free) 0.1623
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3757
    Shell Resolution(Low) 28.857
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 7189
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.2164
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.062
    f_dihedral_angle_d 15.764
    f_angle_d 0.898
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8294
    Nucleic Acid Atoms 0
    Heterogen Atoms 204
    Solvent Atoms 628
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution REFMAC
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building REFMAC