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X-RAY DIFFRACTION
Materials and Methods page
4AR5
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details pH 6.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 34.36 α = 90
    b = 35.32 β = 90
    c = 43.99 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 295
     
    Diffraction Detector
    Detector PIXEL (PILATUS 6M)
    Type DECTRIS
    Collection Date 2011-03-03
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID29
    Wavelength 0.77
    Site ESRF
    Beamline ID29
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1
    Resolution(Low) 35.32
    Number Reflections(Observed) 28427
    Percent Possible(Observed) 96.7
    R Merge I(Observed) 0.04
    B(Isotropic) From Wilson Plot 11.15
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 1.0
    Resolution(Low) 1.05
    Percent Possible(All) 98.0
    R Merge I(Observed) 0.47
    Mean I Over Sigma(Observed) 2.1
    Redundancy 3.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method ISOMORPHOUS REPLACEMENT
    reflnsShellList 1.0
    Resolution(Low) 27.54
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 28386
    Number of Reflections(R-Free) 1439
    Percent Reflections(Observed) 95.92
    R-Factor(Observed) 0.1099
    R-Work 0.1095
    R-Free 0.1189
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.2004
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.1398
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.0606
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0
    Shell Resolution(Low) 1.0357
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.2001
    R-Factor(R-Free) 0.2243
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0357
    Shell Resolution(Low) 1.0772
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.1596
    R-Factor(R-Free) 0.1519
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0772
    Shell Resolution(Low) 1.1262
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2736
    R-Factor(R-Work) 0.1131
    R-Factor(R-Free) 0.1135
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1262
    Shell Resolution(Low) 1.1856
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2766
    R-Factor(R-Work) 0.0963
    R-Factor(R-Free) 0.1103
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1856
    Shell Resolution(Low) 1.2599
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.0926
    R-Factor(R-Free) 0.1086
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2599
    Shell Resolution(Low) 1.3572
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2651
    R-Factor(R-Work) 0.0892
    R-Factor(R-Free) 0.1006
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3572
    Shell Resolution(Low) 1.4938
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2727
    R-Factor(R-Work) 0.0821
    R-Factor(R-Free) 0.098
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4938
    Shell Resolution(Low) 1.7099
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.079
    R-Factor(R-Free) 0.1009
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7099
    Shell Resolution(Low) 2.1541
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.0912
    R-Factor(R-Free) 0.1122
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1541
    Shell Resolution(Low) 27.5504
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1296
    R-Factor(R-Free) 0.127
    Percent Reflections(Observed) 89.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.079
    f_dihedral_angle_d 11.701
    f_angle_d 1.229
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 421
    Nucleic Acid Atoms 0
    Heterogen Atoms 1
    Solvent Atoms 135
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHENIX
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHENIX