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X-RAY DIFFRACTION
Materials and Methods page
4AQ6
  •   Crystallization Hide
    Crystallization Experiments
    pH 8
    Details VAPOUR DIFFUSION (1:1 MIX): 17 % PEG 3350, 0.02 M NAK PHOSPHATE AND 0.1 M BIS-TRIS PROPANE PH 8.0, 1 MM TCEP, 2 MICROMETER HOMOGENTISATE, 15 MG/ML PROTEIN
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 93.39 α = 87.69
    b = 93.71 β = 80.42
    c = 162.98 γ = 68.39
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength 0.9184
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.9
    Resolution(High) 1.98
    Resolution(Low) 35
    Number Reflections(Observed) 337386
    Percent Possible(Observed) 95.6
    R Merge I(Observed) 0.1
    B(Isotropic) From Wilson Plot 18.35
    Redundancy 2.9
     
    High Resolution Shell Details
    Resolution(High) 1.98
    Resolution(Low) 2.03
    Percent Possible(All) 91.5
    R Merge I(Observed) 0.59
    Mean I Over Sigma(Observed) 1.9
    Redundancy 2.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.98
    Resolution(Low) 34.174
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 337340
    Number of Reflections(R-Free) 16868
    Percent Reflections(Observed) 95.64
    R-Factor(Observed) 0.1639
    R-Work 0.1611
    R-Free 0.2162
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.5888
    Anisotropic B[1][2] -1.7846
    Anisotropic B[1][3] -0.7527
    Anisotropic B[2][2] 3.5953
    Anisotropic B[2][3] 0.5927
    Anisotropic B[3][3] 0.9935
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.98
    Shell Resolution(Low) 2.0025
    Number of Reflections(R-Free) 537
    Number of Reflections(R-Work) 10191
    R-Factor(R-Work) 0.2465
    R-Factor(R-Free) 0.3105
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0025
    Shell Resolution(Low) 2.0261
    Number of Reflections(R-Free) 541
    Number of Reflections(R-Work) 10277
    R-Factor(R-Work) 0.2308
    R-Factor(R-Free) 0.2884
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0261
    Shell Resolution(Low) 2.0508
    Number of Reflections(R-Free) 538
    Number of Reflections(R-Work) 10252
    R-Factor(R-Work) 0.2196
    R-Factor(R-Free) 0.2844
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0508
    Shell Resolution(Low) 2.0767
    Number of Reflections(R-Free) 545
    Number of Reflections(R-Work) 10349
    R-Factor(R-Work) 0.236
    R-Factor(R-Free) 0.289
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0767
    Shell Resolution(Low) 2.104
    Number of Reflections(R-Free) 540
    Number of Reflections(R-Work) 10257
    R-Factor(R-Work) 0.22
    R-Factor(R-Free) 0.2882
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.104
    Shell Resolution(Low) 2.1329
    Number of Reflections(R-Free) 552
    Number of Reflections(R-Work) 10480
    R-Factor(R-Work) 0.1925
    R-Factor(R-Free) 0.2608
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1329
    Shell Resolution(Low) 2.1633
    Number of Reflections(R-Free) 553
    Number of Reflections(R-Work) 10519
    R-Factor(R-Work) 0.1952
    R-Factor(R-Free) 0.2686
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1633
    Shell Resolution(Low) 2.1956
    Number of Reflections(R-Free) 557
    Number of Reflections(R-Work) 10567
    R-Factor(R-Work) 0.1997
    R-Factor(R-Free) 0.2613
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1956
    Shell Resolution(Low) 2.2299
    Number of Reflections(R-Free) 558
    Number of Reflections(R-Work) 10617
    R-Factor(R-Work) 0.1882
    R-Factor(R-Free) 0.2681
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2299
    Shell Resolution(Low) 2.2665
    Number of Reflections(R-Free) 550
    Number of Reflections(R-Work) 10434
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.2732
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2665
    Shell Resolution(Low) 2.3055
    Number of Reflections(R-Free) 559
    Number of Reflections(R-Work) 10610
    R-Factor(R-Work) 0.1751
    R-Factor(R-Free) 0.2339
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3055
    Shell Resolution(Low) 2.3474
    Number of Reflections(R-Free) 565
    Number of Reflections(R-Work) 10749
    R-Factor(R-Work) 0.1862
    R-Factor(R-Free) 0.2679
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3474
    Shell Resolution(Low) 2.3926
    Number of Reflections(R-Free) 565
    Number of Reflections(R-Work) 10727
    R-Factor(R-Work) 0.1811
    R-Factor(R-Free) 0.2555
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3926
    Shell Resolution(Low) 2.4414
    Number of Reflections(R-Free) 562
    Number of Reflections(R-Work) 10678
    R-Factor(R-Work) 0.1629
    R-Factor(R-Free) 0.2251
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4414
    Shell Resolution(Low) 2.4945
    Number of Reflections(R-Free) 565
    Number of Reflections(R-Work) 10735
    R-Factor(R-Work) 0.1798
    R-Factor(R-Free) 0.2518
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4945
    Shell Resolution(Low) 2.5525
    Number of Reflections(R-Free) 570
    Number of Reflections(R-Work) 10836
    R-Factor(R-Work) 0.1642
    R-Factor(R-Free) 0.2362
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5525
    Shell Resolution(Low) 2.6163
    Number of Reflections(R-Free) 571
    Number of Reflections(R-Work) 10842
    R-Factor(R-Work) 0.1793
    R-Factor(R-Free) 0.2596
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6163
    Shell Resolution(Low) 2.687
    Number of Reflections(R-Free) 567
    Number of Reflections(R-Work) 10769
    R-Factor(R-Work) 0.1791
    R-Factor(R-Free) 0.2478
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.687
    Shell Resolution(Low) 2.766
    Number of Reflections(R-Free) 572
    Number of Reflections(R-Work) 10876
    R-Factor(R-Work) 0.1749
    R-Factor(R-Free) 0.252
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.766
    Shell Resolution(Low) 2.8553
    Number of Reflections(R-Free) 570
    Number of Reflections(R-Work) 10817
    R-Factor(R-Work) 0.1621
    R-Factor(R-Free) 0.2328
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8553
    Shell Resolution(Low) 2.9573
    Number of Reflections(R-Free) 569
    Number of Reflections(R-Work) 10821
    R-Factor(R-Work) 0.1592
    R-Factor(R-Free) 0.232
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9573
    Shell Resolution(Low) 3.0756
    Number of Reflections(R-Free) 573
    Number of Reflections(R-Work) 10882
    R-Factor(R-Work) 0.1538
    R-Factor(R-Free) 0.2062
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0756
    Shell Resolution(Low) 3.2155
    Number of Reflections(R-Free) 573
    Number of Reflections(R-Work) 10887
    R-Factor(R-Work) 0.1584
    R-Factor(R-Free) 0.2121
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2155
    Shell Resolution(Low) 3.3849
    Number of Reflections(R-Free) 571
    Number of Reflections(R-Work) 10854
    R-Factor(R-Work) 0.143
    R-Factor(R-Free) 0.1984
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3849
    Shell Resolution(Low) 3.5967
    Number of Reflections(R-Free) 574
    Number of Reflections(R-Work) 10895
    R-Factor(R-Work) 0.1392
    R-Factor(R-Free) 0.1836
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5967
    Shell Resolution(Low) 3.8741
    Number of Reflections(R-Free) 570
    Number of Reflections(R-Work) 10832
    R-Factor(R-Work) 0.1339
    R-Factor(R-Free) 0.1796
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8741
    Shell Resolution(Low) 4.2633
    Number of Reflections(R-Free) 574
    Number of Reflections(R-Work) 10913
    R-Factor(R-Work) 0.1202
    R-Factor(R-Free) 0.1492
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2633
    Shell Resolution(Low) 4.8787
    Number of Reflections(R-Free) 575
    Number of Reflections(R-Work) 10917
    R-Factor(R-Work) 0.1173
    R-Factor(R-Free) 0.1459
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8787
    Shell Resolution(Low) 6.1408
    Number of Reflections(R-Free) 575
    Number of Reflections(R-Work) 10929
    R-Factor(R-Work) 0.135
    R-Factor(R-Free) 0.1755
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1408
    Shell Resolution(Low) 34.179
    Number of Reflections(R-Free) 577
    Number of Reflections(R-Work) 10960
    R-Factor(R-Work) 0.1453
    R-Factor(R-Free) 0.1771
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.072
    f_dihedral_angle_d 13.877
    f_angle_d 1.062
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 39512
    Nucleic Acid Atoms 0
    Heterogen Atoms 175
    Solvent Atoms 4580
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7.3_928)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.7.3_928)
    model building PHASER