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X-RAY DIFFRACTION
Materials and Methods page
4AQ2
  •   Crystallization Hide
    Crystallization Experiments
    pH 8
    Details VAPOUR DIFFUSION(1:1): 17 % PEG 3350, 0.02 M NAK PHOSPHATE, 0.1 M BIS-TRIS PROPANE PH 8.0, 1 MM TCEP 15 MG/ML PROTEIN
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 93.74 α = 87.46
    b = 93.9 β = 80.45
    c = 162.81 γ = 68.33
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MAR225)
    Type MARRESEARCH
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength 0.9184
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.95
    Resolution(Low) 34
    Number Reflections(Observed) 359608
    Percent Possible(Observed) 94.0
    R Merge I(Observed) 0.09
    B(Isotropic) From Wilson Plot 16.33
    Redundancy 2.9
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 2.0
    Percent Possible(All) 80.0
    R Merge I(Observed) 0.44
    Mean I Over Sigma(Observed) 2.38
    Redundancy 2.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.95
    Resolution(Low) 33.936
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 351605
    Number of Reflections(R-Free) 17580
    Percent Reflections(Observed) 94.82
    R-Factor(Observed) 0.1958
    R-Work 0.1925
    R-Free 0.2573
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.431
    Anisotropic B[1][2] 0.5355
    Anisotropic B[1][3] 0.7097
    Anisotropic B[2][2] 1.5511
    Anisotropic B[2][3] 5.0E-4
    Anisotropic B[3][3] 1.2577
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.95
    Shell Resolution(Low) 2.0197
    Number of Reflections(R-Free) 1550
    Number of Reflections(R-Work) 29444
    R-Factor(R-Work) 0.2299
    R-Factor(R-Free) 0.3193
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0197
    Shell Resolution(Low) 2.1005
    Number of Reflections(R-Free) 1772
    Number of Reflections(R-Work) 33672
    R-Factor(R-Work) 0.2127
    R-Factor(R-Free) 0.2995
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1005
    Shell Resolution(Low) 2.1961
    Number of Reflections(R-Free) 1782
    Number of Reflections(R-Work) 33854
    R-Factor(R-Work) 0.2007
    R-Factor(R-Free) 0.2899
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1961
    Shell Resolution(Low) 2.3119
    Number of Reflections(R-Free) 1759
    Number of Reflections(R-Work) 33425
    R-Factor(R-Work) 0.1972
    R-Factor(R-Free) 0.2847
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3119
    Shell Resolution(Low) 2.4567
    Number of Reflections(R-Free) 1795
    Number of Reflections(R-Work) 34114
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.2863
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4567
    Shell Resolution(Low) 2.6463
    Number of Reflections(R-Free) 1791
    Number of Reflections(R-Work) 34026
    R-Factor(R-Work) 0.1875
    R-Factor(R-Free) 0.2704
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6463
    Shell Resolution(Low) 2.9125
    Number of Reflections(R-Free) 1800
    Number of Reflections(R-Work) 34201
    R-Factor(R-Work) 0.1905
    R-Factor(R-Free) 0.268
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9125
    Shell Resolution(Low) 3.3336
    Number of Reflections(R-Free) 1794
    Number of Reflections(R-Work) 34078
    R-Factor(R-Work) 0.1868
    R-Factor(R-Free) 0.2448
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3336
    Shell Resolution(Low) 4.1988
    Number of Reflections(R-Free) 1777
    Number of Reflections(R-Work) 33767
    R-Factor(R-Work) 0.182
    R-Factor(R-Free) 0.2274
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1988
    Shell Resolution(Low) 33.9409
    Number of Reflections(R-Free) 1760
    Number of Reflections(R-Work) 33444
    R-Factor(R-Work) 0.1896
    R-Factor(R-Free) 0.2208
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.076
    f_dihedral_angle_d 14.053
    f_angle_d 1.109
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 39464
    Nucleic Acid Atoms 0
    Heterogen Atoms 31
    Solvent Atoms 5676
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER