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X-RAY DIFFRACTION
Materials and Methods page
4APO
  •   Crystallization Hide
    Crystallization Experiments
    Details PEG 3350, AMMONIUM SULFATE, BIS-TRIS PH 5.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 60.2 α = 90
    b = 106.82 β = 100.85
    c = 68.47 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Details MIRRRORS
    Collection Date 2011-07-09
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I02
    Wavelength 0.97950
    Site DIAMOND
    Beamline I02
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.9
    Resolution(Low) 8.52
    Number Reflections(Observed) 32055
    Percent Possible(Observed) 96.3
    R Merge I(Observed) 0.04
    B(Isotropic) From Wilson Plot 24.09
    Redundancy 3.4
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.95
    Percent Possible(All) 90.9
    R Merge I(Observed) 0.13
    Mean I Over Sigma(Observed) 8.7
    Redundancy 2.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.895
    Resolution(Low) 28.454
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 28495
    Number of Reflections(R-Free) 1455
    Percent Reflections(Observed) 84.52
    R-Factor(Observed) 0.1836
    R-Work 0.1809
    R-Free 0.2344
     
    Temperature Factor Modeling
    Mean Isotropic B Value 26.017
    Anisotropic B[1][1] 3.3253
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 7.7211
    Anisotropic B[2][2] -1.3015
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.0238
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.895
    Shell Resolution(Low) 1.9628
    Number of Reflections(R-Free) 95
    Number of Reflections(R-Work) 1709
    R-Factor(R-Work) 0.4615
    R-Factor(R-Free) 0.4868
    Percent Reflections(Observed) 54.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9628
    Shell Resolution(Low) 2.0413
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 3133
    R-Factor(R-Work) 0.2198
    R-Factor(R-Free) 0.2836
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0413
    Shell Resolution(Low) 2.1342
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2465
    R-Factor(R-Work) 0.186
    R-Factor(R-Free) 0.25
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1342
    Shell Resolution(Low) 2.2467
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.2143
    R-Factor(R-Free) 0.2594
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2467
    Shell Resolution(Low) 2.3874
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2596
    R-Factor(R-Work) 0.2074
    R-Factor(R-Free) 0.2991
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3874
    Shell Resolution(Low) 2.5716
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3155
    R-Factor(R-Work) 0.1729
    R-Factor(R-Free) 0.2436
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5716
    Shell Resolution(Low) 2.8302
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.1683
    R-Factor(R-Free) 0.2193
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8302
    Shell Resolution(Low) 3.2392
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 3112
    R-Factor(R-Work) 0.1694
    R-Factor(R-Free) 0.2126
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2392
    Shell Resolution(Low) 4.0791
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2491
    R-Factor(R-Work) 0.1529
    R-Factor(R-Free) 0.2185
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0791
    Shell Resolution(Low) 28.4574
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 3045
    R-Factor(R-Work) 0.167
    R-Factor(R-Free) 0.201
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.068
    f_dihedral_angle_d 14.484
    f_angle_d 0.906
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2422
    Nucleic Acid Atoms 0
    Heterogen Atoms 42
    Solvent Atoms 478
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER FOR MR
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER version: FOR MR