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X-RAY DIFFRACTION
Materials and Methods page
4AOR
  •   Crystallization Hide
    Crystallization Experiments
    Details TRYPSIN (SIGMA T1426) WAS DUSIKVED UB 1MM HCL (PH 2.0), 10 MM CACL2, PURIFIED ON A SUPERDEX 75 16/60 COLUMN (BUFFER: 25 MM MES PH 5.5, 50 MM NACL AND 10 MM CACL2). CRYSTALS GREW FROM EQUAL VOL. OF TRYPSIN (11.5 MG/ML) INCUBATED WITH LYOPHILIZED SOTI-III (2.5 MM) AND PRECIPITANT SOLUTION (0.1 M IMIDAZOLE PH 7.5, 12 % (W/V) PEG 8K) IN HANGING DROP CRYSTALLIZATION PLATES AT 19C.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.35 α = 90
    b = 66.82 β = 90.17
    c = 108.89 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
    Collection Date 2010-11-30
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength 0.91841
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.7
    Resolution(Low) 15
    Number Reflections(Observed) 75899
    Percent Possible(Observed) 97.3
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 13.88
    Redundancy 3.8
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.8
    Percent Possible(All) 93.7
    R Merge I(Observed) 0.49
    Mean I Over Sigma(Observed) 2.85
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.702
    Resolution(Low) 32.04
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 75888
    Number of Reflections(R-Free) 3794
    Percent Reflections(Observed) 97.72
    R-Factor(Observed) 0.1808
    R-Work 0.1787
    R-Free 0.2209
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.6926
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.6891
    Anisotropic B[2][2] 0.6962
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.3888
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7022
    Shell Resolution(Low) 1.7237
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2487
    R-Factor(R-Work) 0.2136
    R-Factor(R-Free) 0.2809
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7237
    Shell Resolution(Low) 1.7464
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.213
    R-Factor(R-Free) 0.2616
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7464
    Shell Resolution(Low) 1.7703
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.2033
    R-Factor(R-Free) 0.2424
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7703
    Shell Resolution(Low) 1.7956
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.1961
    R-Factor(R-Free) 0.2558
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7956
    Shell Resolution(Low) 1.8224
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.2032
    R-Factor(R-Free) 0.2447
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8224
    Shell Resolution(Low) 1.8509
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.1989
    R-Factor(R-Free) 0.263
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8509
    Shell Resolution(Low) 1.8812
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.2545
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8812
    Shell Resolution(Low) 1.9136
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.1798
    R-Factor(R-Free) 0.2451
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9136
    Shell Resolution(Low) 1.9484
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.1877
    R-Factor(R-Free) 0.2383
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9484
    Shell Resolution(Low) 1.9859
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.1744
    R-Factor(R-Free) 0.2278
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9859
    Shell Resolution(Low) 2.0264
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.1778
    R-Factor(R-Free) 0.2107
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0264
    Shell Resolution(Low) 2.0705
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.2403
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0705
    Shell Resolution(Low) 2.1186
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.1824
    R-Factor(R-Free) 0.2178
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1186
    Shell Resolution(Low) 2.1716
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.1765
    R-Factor(R-Free) 0.2648
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1716
    Shell Resolution(Low) 2.2303
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.1768
    R-Factor(R-Free) 0.2037
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2303
    Shell Resolution(Low) 2.2959
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.1726
    R-Factor(R-Free) 0.2351
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2959
    Shell Resolution(Low) 2.37
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.1789
    R-Factor(R-Free) 0.2388
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.37
    Shell Resolution(Low) 2.4547
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.1803
    R-Factor(R-Free) 0.2141
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4547
    Shell Resolution(Low) 2.5529
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.1842
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5529
    Shell Resolution(Low) 2.6691
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2702
    R-Factor(R-Work) 0.1798
    R-Factor(R-Free) 0.2363
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6691
    Shell Resolution(Low) 2.8097
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.1949
    R-Factor(R-Free) 0.2667
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8097
    Shell Resolution(Low) 2.9856
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2718
    R-Factor(R-Work) 0.1897
    R-Factor(R-Free) 0.2348
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9856
    Shell Resolution(Low) 3.216
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2691
    R-Factor(R-Work) 0.1748
    R-Factor(R-Free) 0.2297
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.216
    Shell Resolution(Low) 3.5392
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.1809
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5392
    Shell Resolution(Low) 4.0505
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.1585
    R-Factor(R-Free) 0.1985
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0505
    Shell Resolution(Low) 5.0999
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2740
    R-Factor(R-Work) 0.1543
    R-Factor(R-Free) 0.1828
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0999
    Shell Resolution(Low) 32.0456
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2787
    R-Factor(R-Work) 0.1833
    R-Factor(R-Free) 0.1936
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.09
    f_dihedral_angle_d 13.606
    f_angle_d 1.304
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5600
    Nucleic Acid Atoms 0
    Heterogen Atoms 89
    Solvent Atoms 580
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER