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X-RAY DIFFRACTION
Materials and Methods page
4AOQ
  •   Crystallization Hide
    Crystallization Experiments
    Details TRYPSIN (SIGMA T1426) WAS DISOLVED IN 1 MM HCL (PH 2.0), 10 MM CACL2, PURIFIED ON A SUPERDEX 75 16/60 COLUMN (BUFFER: 25 MM MES PH 5.5, 50 MM NACL AND 10 MM CACL2). CRYSTALS GREW FROM EQUAL VOLUMES OF TRYPSIN (11.5 MG/ML) INCUBATED WITH LYOPHILIZED SOTI-III F14A (1.5MM) AND PRECIPITANT SOLUTION (0.1M BICINE PH 9, 20% (W/V) PEG 6000) IN HANGING DROP CRYSTALLIZATION PLATES AT 19C.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 48.51 α = 90
    b = 68.38 β = 93.25
    c = 109.79 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
    Collection Date 2011-09-28
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength 0.91841
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2
    Resolution(Low) 20
    Number Reflections(Observed) 48020
    Percent Possible(Observed) 98.7
    R Merge I(Observed) 0.14
    B(Isotropic) From Wilson Plot 10.57
    Redundancy 3.2
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.1
    Percent Possible(All) 98.5
    R Merge I(Observed) 0.45
    Mean I Over Sigma(Observed) 2.9
    Redundancy 3.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0
    Resolution(Low) 19.889
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 48006
    Number of Reflections(R-Free) 2405
    Percent Reflections(Observed) 98.82
    R-Factor(Observed) 0.1694
    R-Work 0.1667
    R-Free 0.2202
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 3.845
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.9015
    Anisotropic B[2][2] -1.7329
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.1121
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.0408
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.2059
    R-Factor(R-Free) 0.2947
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0408
    Shell Resolution(Low) 2.0851
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.1946
    R-Factor(R-Free) 0.2422
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0851
    Shell Resolution(Low) 2.1336
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2651
    R-Factor(R-Work) 0.1781
    R-Factor(R-Free) 0.2855
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1336
    Shell Resolution(Low) 2.1869
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1762
    R-Factor(R-Free) 0.2503
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1869
    Shell Resolution(Low) 2.2459
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2632
    R-Factor(R-Work) 0.175
    R-Factor(R-Free) 0.239
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2459
    Shell Resolution(Low) 2.3119
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.1777
    R-Factor(R-Free) 0.2193
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3119
    Shell Resolution(Low) 2.3864
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.1657
    R-Factor(R-Free) 0.2326
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3864
    Shell Resolution(Low) 2.4716
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.1722
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4716
    Shell Resolution(Low) 2.5703
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.1673
    R-Factor(R-Free) 0.2452
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5703
    Shell Resolution(Low) 2.687
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.173
    R-Factor(R-Free) 0.2519
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.687
    Shell Resolution(Low) 2.8283
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.1775
    R-Factor(R-Free) 0.2471
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8283
    Shell Resolution(Low) 3.005
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.1777
    R-Factor(R-Free) 0.2255
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.005
    Shell Resolution(Low) 3.2361
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.1718
    R-Factor(R-Free) 0.1928
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2361
    Shell Resolution(Low) 3.5601
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2663
    R-Factor(R-Work) 0.1695
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5601
    Shell Resolution(Low) 4.0714
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2727
    R-Factor(R-Work) 0.1474
    R-Factor(R-Free) 0.1834
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0714
    Shell Resolution(Low) 5.115
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.1275
    R-Factor(R-Free) 0.1653
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.115
    Shell Resolution(Low) 19.8901
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2764
    R-Factor(R-Work) 0.1545
    R-Factor(R-Free) 0.1992
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.06
    f_dihedral_angle_d 14.015
    f_angle_d 0.862
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5601
    Nucleic Acid Atoms 0
    Heterogen Atoms 19
    Solvent Atoms 656
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER