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X-RAY DIFFRACTION
Materials and Methods page
4AOH
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details 20 % PEG 4K, 0.05 M NA/K TARTRATE, 0.1 M NACL, 0.1 M HEPES PH 7.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 85.55 α = 90
    b = 37.51 β = 90
    c = 37.51 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (Q315)
    Type ADSC
    Collection Date 2008-05-17
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I02
    Wavelength 0.9796
    Site DIAMOND
    Beamline I02
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.04
    Resolution(Low) 50
    Number Reflections(Observed) 58714
    Percent Possible(Observed) 82.7
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 11.92
    Redundancy 11.2
     
    High Resolution Shell Details
    Resolution(High) 1.04
    Resolution(Low) 1.08
    Percent Possible(All) 37.3
    R Merge I(Observed) 0.43
    Mean I Over Sigma(Observed) 1.9
    Redundancy 2.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.041
    Resolution(Low) 42.774
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 48524
    Number of Reflections(R-Free) 2463
    Percent Reflections(Observed) 82.69
    R-Factor(Observed) 0.1698
    R-Work 0.1689
    R-Free 0.1879
     
    Temperature Factor Modeling
    Mean Isotropic B Value 17.9
    Anisotropic B[1][1] -0.0236
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.3581
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.3818
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0407
    Shell Resolution(Low) 1.0607
    Number of Reflections(R-Free) 54
    Number of Reflections(R-Work) 916
    R-Factor(R-Work) 0.3266
    R-Factor(R-Free) 0.3669
    Percent Reflections(Observed) 31.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0607
    Shell Resolution(Low) 1.0824
    Number of Reflections(R-Free) 55
    Number of Reflections(R-Work) 1447
    R-Factor(R-Work) 0.2473
    R-Factor(R-Free) 0.2769
    Percent Reflections(Observed) 47.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0824
    Shell Resolution(Low) 1.1059
    Number of Reflections(R-Free) 89
    Number of Reflections(R-Work) 1721
    R-Factor(R-Work) 0.2043
    R-Factor(R-Free) 0.2124
    Percent Reflections(Observed) 56.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1059
    Shell Resolution(Low) 1.1317
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2008
    R-Factor(R-Work) 0.1592
    R-Factor(R-Free) 0.2083
    Percent Reflections(Observed) 66.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1317
    Shell Resolution(Low) 1.16
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 2192
    R-Factor(R-Work) 0.1438
    R-Factor(R-Free) 0.2038
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.16
    Shell Resolution(Low) 1.1913
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2383
    R-Factor(R-Work) 0.1452
    R-Factor(R-Free) 0.1412
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1913
    Shell Resolution(Low) 1.2264
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.1425
    R-Factor(R-Free) 0.1691
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2264
    Shell Resolution(Low) 1.266
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2747
    R-Factor(R-Work) 0.1423
    R-Factor(R-Free) 0.1609
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.266
    Shell Resolution(Low) 1.3112
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2887
    R-Factor(R-Work) 0.1356
    R-Factor(R-Free) 0.1594
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3112
    Shell Resolution(Low) 1.3637
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2930
    R-Factor(R-Work) 0.1314
    R-Factor(R-Free) 0.1584
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3637
    Shell Resolution(Low) 1.4258
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2946
    R-Factor(R-Work) 0.1277
    R-Factor(R-Free) 0.1528
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4258
    Shell Resolution(Low) 1.501
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2983
    R-Factor(R-Work) 0.1312
    R-Factor(R-Free) 0.1648
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.501
    Shell Resolution(Low) 1.595
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2960
    R-Factor(R-Work) 0.1336
    R-Factor(R-Free) 0.1614
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.595
    Shell Resolution(Low) 1.7182
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3017
    R-Factor(R-Work) 0.1435
    R-Factor(R-Free) 0.1651
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7182
    Shell Resolution(Low) 1.8911
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3017
    R-Factor(R-Work) 0.1536
    R-Factor(R-Free) 0.1795
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8911
    Shell Resolution(Low) 2.1647
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 3080
    R-Factor(R-Work) 0.1672
    R-Factor(R-Free) 0.1981
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1647
    Shell Resolution(Low) 2.7272
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3095
    R-Factor(R-Work) 0.1832
    R-Factor(R-Free) 0.2137
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7272
    Shell Resolution(Low) 42.8107
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 3106
    R-Factor(R-Work) 0.1949
    R-Factor(R-Free) 0.193
    Percent Reflections(Observed) 93.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.077
    f_dihedral_angle_d 11.001
    f_angle_d 1.136
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 980
    Nucleic Acid Atoms 0
    Heterogen Atoms 20
    Solvent Atoms 155
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL2000
    Data Reduction (data scaling) HKL2000
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building MOLREP