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X-RAY DIFFRACTION
Materials and Methods page
4AMH
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Details SITTING DROP VAPOR DIFFUSION, 0.1 M MES PH 6.0, 2.4 M AMMONIUM SULFATE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 106.9 α = 90
    b = 43.6 β = 103.7
    c = 51.7 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD(MX-225)
    Type MARRESEARCH
    Details PT COATED MIRRORS
    Collection Date 2011-09-03
     
    Diffraction Radiation
    Monochromator SI (111) MONOCHROMATOR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-2
    Wavelength 0.8726
    Site ESRF
    Beamline ID23-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.1
    Resolution(High) 2.3
    Resolution(Low) 41.3
    Number Reflections(Observed) 10415
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 32.75
    Redundancy 3.71
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.35
    Percent Possible(All) 98.9
    R Merge I(Observed) 0.65
    Mean I Over Sigma(Observed) 2.2
    Redundancy 3.74
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 41.324
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 10415
    Number of Reflections(R-Free) 521
    Percent Reflections(Observed) 99.46
    R-Factor(Observed) 0.222
    R-Work 0.2196
    R-Free 0.2683
     
    Temperature Factor Modeling
    Mean Isotropic B Value 40.37
    Anisotropic B[1][1] -10.1541
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -6.0282
    Anisotropic B[2][2] 23.746
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -13.592
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3002
    Shell Resolution(Low) 2.5316
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2436
    R-Factor(R-Work) 0.2898
    R-Factor(R-Free) 0.4151
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5316
    Shell Resolution(Low) 2.8978
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2461
    R-Factor(R-Work) 0.2641
    R-Factor(R-Free) 0.3048
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8978
    Shell Resolution(Low) 3.6506
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2465
    R-Factor(R-Work) 0.2294
    R-Factor(R-Free) 0.3106
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6506
    Shell Resolution(Low) 41.3307
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2529
    R-Factor(R-Work) 0.1825
    R-Factor(R-Free) 0.1926
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.076
    f_dihedral_angle_d 15.658
    f_angle_d 1.264
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1386
    Nucleic Acid Atoms 0
    Heterogen Atoms 14
    Solvent Atoms 53
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER