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X-RAY DIFFRACTION
Materials and Methods page
4ALV
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.2
    Details pH 7.2
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 96.87 α = 90
    b = 96.87 β = 90
    c = 80.84 γ = 120
     
    Space Group
    Space Group Name:    P 65
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 155
     
    Diffraction Detector
    Detector CCD (MX-325)
    Type MARRESEARCH
    Collection Date 2006-11-30
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL9-2
    Wavelength 0.97946
    Site SSRL
    Beamline BL9-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.59
    Resolution(Low) 48.45
    Number Reflections(Observed) 13533
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.14
    B(Isotropic) From Wilson Plot 44.9
    Redundancy 3.96
     
    High Resolution Shell Details
    Resolution(High) 2.59
    Resolution(Low) 3.0
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.78
    Mean I Over Sigma(Observed) 2.0
    Redundancy 5.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.59
    Resolution(Low) 48.45
    Number of Reflections(Observed) 12828
    Number of Reflections(R-Free) 668
    Percent Reflections(Observed) 99.73
    R-Factor(Observed) 0.19469
    R-Work 0.19163
    R-Free 0.25554
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 34.186
    Anisotropic B[1][1] 0.03
    Anisotropic B[1][2] 0.02
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.03
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.05
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.59
    Shell Resolution(Low) 2.657
    Number of Reflections(R-Free) 59
    Number of Reflections(R-Work) 930
    R-Factor(R-Work) 0.34
    R-Factor(R-Free) 0.393
    Percent Reflections(Observed) 99.9
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 2.805
    r_scbond_it 1.899
    r_mcangle_it 1.44
    r_mcbond_other 0.157
    r_mcbond_it 1.207
    r_nbd_refined 0.243
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.006
    r_chiral_restr 0.162
    r_dihedral_angle_4_deg 20.502
    r_dihedral_angle_3_deg 18.944
    r_dihedral_angle_2_deg 35.156
    r_dihedral_angle_1_deg 6.86
    r_angle_other_deg 1.62
    r_angle_refined_deg 1.776
    r_bond_other_d 0.002
    r_bond_refined_d 0.018
    r_nbd_other 0.218
    r_nbtor_refined 0.202
    r_nbtor_other 0.105
    r_xyhbond_nbd_refined 0.173
    r_xyhbond_nbd_other 0.017
    r_symmetry_vdw_refined 0.166
    r_symmetry_vdw_other 0.258
    r_symmetry_hbond_refined 0.205
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2230
    Nucleic Acid Atoms 0
    Heterogen Atoms 35
    Solvent Atoms 72
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement REFMAC 5.2.0019
     
    Software
    refinement REFMAC version: 5.2.0019
    model building PHASER