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X-RAY DIFFRACTION
Materials and Methods page
4AK9
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.6
    Details 0.2M SODIUM NITRATE, 0.1M BIS-TRIS PROPANE PH6.5, 20% PEG3350, pH 6.6
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 67.58 α = 90
    b = 123.46 β = 90
    c = 75.04 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PILATUS 6M
    Type DECTRIS
    Details MIRRORS
    Collection Date 2011-05-27
     
    Diffraction Radiation
    Monochromator SI(111) MONOCHROMATOR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength 1.0000
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.8
    Resolution(Low) 47.7
    Number Reflections(Observed) 58928
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.14
    B(Isotropic) From Wilson Plot 36.0
    Redundancy 21.4
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.85
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.94
    Mean I Over Sigma(Observed) 4.28
    Redundancy 26.62
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.8
    Resolution(Low) 47.672
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 58921
    Number of Reflections(R-Free) 2981
    Percent Reflections(Observed) 99.98
    R-Factor(Observed) 0.217
    R-Work 0.2153
    R-Free 0.2468
     
    Temperature Factor Modeling
    Mean Isotropic B Value 33.0
    Anisotropic B[1][1] 0.7631
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.5453
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.3084
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8
    Shell Resolution(Low) 1.8295
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 2788
    R-Factor(R-Work) 0.304
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8295
    Shell Resolution(Low) 1.8611
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.2836
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8611
    Shell Resolution(Low) 1.8949
    Number of Reflections(R-Free) 366
    Number of Reflections(R-Work) 2415
    R-Factor(R-Work) 0.2682
    R-Factor(R-Free) 0.3151
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8949
    Shell Resolution(Low) 1.9313
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 2804
    R-Factor(R-Work) 0.2587
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9313
    Shell Resolution(Low) 1.9708
    Number of Reflections(R-Free) 236
    Number of Reflections(R-Work) 2508
    R-Factor(R-Work) 0.2577
    R-Factor(R-Free) 0.3161
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9708
    Shell Resolution(Low) 2.0136
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2655
    R-Factor(R-Work) 0.26
    R-Factor(R-Free) 0.2621
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0136
    Shell Resolution(Low) 2.0605
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 2799
    R-Factor(R-Work) 0.2707
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0605
    Shell Resolution(Low) 2.112
    Number of Reflections(R-Free) 304
    Number of Reflections(R-Work) 2465
    R-Factor(R-Work) 0.2615
    R-Factor(R-Free) 0.3068
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.112
    Shell Resolution(Low) 2.1691
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 2773
    R-Factor(R-Work) 0.2481
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1691
    Shell Resolution(Low) 2.2329
    Number of Reflections(R-Free) 289
    Number of Reflections(R-Work) 2494
    R-Factor(R-Work) 0.2422
    R-Factor(R-Free) 0.2755
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2329
    Shell Resolution(Low) 2.305
    Number of Reflections(R-Free) 268
    Number of Reflections(R-Work) 2521
    R-Factor(R-Work) 0.2272
    R-Factor(R-Free) 0.2576
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.305
    Shell Resolution(Low) 2.3874
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 2776
    R-Factor(R-Work) 0.2184
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3874
    Shell Resolution(Low) 2.483
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 2577
    R-Factor(R-Work) 0.2309
    R-Factor(R-Free) 0.2766
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.483
    Shell Resolution(Low) 2.596
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.2274
    R-Factor(R-Free) 0.2654
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.596
    Shell Resolution(Low) 2.7328
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 2796
    R-Factor(R-Work) 0.2296
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7328
    Shell Resolution(Low) 2.904
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.2357
    R-Factor(R-Free) 0.284
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.904
    Shell Resolution(Low) 3.1282
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.2175
    R-Factor(R-Free) 0.2813
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1282
    Shell Resolution(Low) 3.4429
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.2068
    R-Factor(R-Free) 0.2295
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4429
    Shell Resolution(Low) 3.9409
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.1882
    R-Factor(R-Free) 0.2006
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9409
    Shell Resolution(Low) 4.9643
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2741
    R-Factor(R-Work) 0.1656
    R-Factor(R-Free) 0.2079
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9643
    Shell Resolution(Low) 47.689
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2862
    R-Factor(R-Work) 0.1998
    R-Factor(R-Free) 0.2151
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.089
    f_dihedral_angle_d 14.968
    f_angle_d 1.25
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4547
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 485
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHENIX
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHENIX