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X-RAY DIFFRACTION
Materials and Methods page
4AJX
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details 0.6 M IMIDAZOLE/MALONIC ACID PH 7.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 47.31 α = 90
    b = 62.49 β = 111.8
    c = 57.27 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Collection Date 2005-03-15
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength 1.0000
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.2
    Resolution(Low) 40.5
    Number Reflections(Observed) 90966
    Percent Possible(Observed) 92.4
    R Merge I(Observed) 0.036
    B(Isotropic) From Wilson Plot 11.72
    Redundancy 4.2
     
    High Resolution Shell Details
    Resolution(High) 1.2
    Resolution(Low) 1.23
    Percent Possible(All) 60.3
    R Merge I(Observed) 0.41
    Mean I Over Sigma(Observed) 2.51
    Redundancy 2.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.2
    Resolution(Low) 40.497
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 89598
    Number of Reflections(R-Free) 4449
    Percent Reflections(Observed) 92.71
    R-Factor(Observed) 0.1415
    R-Work 0.1405
    R-Free 0.1596
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.4182
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.0188
    Anisotropic B[2][2] -0.3665
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.7847
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2
    Shell Resolution(Low) 1.2136
    Number of Reflections(R-Free) 85
    Number of Reflections(R-Work) 1792
    R-Factor(R-Work) 0.2056
    R-Factor(R-Free) 0.1955
    Percent Reflections(Observed) 58.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2136
    Shell Resolution(Low) 1.2279
    Number of Reflections(R-Free) 96
    Number of Reflections(R-Work) 1900
    R-Factor(R-Work) 0.2926
    R-Factor(R-Free) 0.3409
    Percent Reflections(Observed) 62.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2279
    Shell Resolution(Low) 1.2429
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2077
    R-Factor(R-Work) 0.2184
    R-Factor(R-Free) 0.2163
    Percent Reflections(Observed) 68.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2429
    Shell Resolution(Low) 1.2586
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2276
    R-Factor(R-Work) 0.2103
    R-Factor(R-Free) 0.2221
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2586
    Shell Resolution(Low) 1.2752
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2433
    R-Factor(R-Work) 0.2397
    R-Factor(R-Free) 0.3067
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2752
    Shell Resolution(Low) 1.2927
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2655
    R-Factor(R-Work) 0.1944
    R-Factor(R-Free) 0.2182
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2927
    Shell Resolution(Low) 1.3111
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2903
    R-Factor(R-Work) 0.226
    R-Factor(R-Free) 0.2889
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3111
    Shell Resolution(Low) 1.3307
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3072
    R-Factor(R-Work) 0.1312
    R-Factor(R-Free) 0.1772
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3307
    Shell Resolution(Low) 1.3515
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3083
    R-Factor(R-Work) 0.119
    R-Factor(R-Free) 0.1563
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3515
    Shell Resolution(Low) 1.3737
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2930
    R-Factor(R-Work) 0.1311
    R-Factor(R-Free) 0.1689
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3737
    Shell Resolution(Low) 1.3974
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 2999
    R-Factor(R-Work) 0.1177
    R-Factor(R-Free) 0.1631
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3974
    Shell Resolution(Low) 1.4228
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 3042
    R-Factor(R-Work) 0.1093
    R-Factor(R-Free) 0.134
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4228
    Shell Resolution(Low) 1.4501
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 3009
    R-Factor(R-Work) 0.1207
    R-Factor(R-Free) 0.1596
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4501
    Shell Resolution(Low) 1.4797
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3017
    R-Factor(R-Work) 0.1244
    R-Factor(R-Free) 0.1762
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4797
    Shell Resolution(Low) 1.5119
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 3046
    R-Factor(R-Work) 0.1005
    R-Factor(R-Free) 0.1356
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5119
    Shell Resolution(Low) 1.5471
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2906
    R-Factor(R-Work) 0.1061
    R-Factor(R-Free) 0.1375
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5471
    Shell Resolution(Low) 1.5858
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3039
    R-Factor(R-Work) 0.0956
    R-Factor(R-Free) 0.1335
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5858
    Shell Resolution(Low) 1.6286
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 3067
    R-Factor(R-Work) 0.0935
    R-Factor(R-Free) 0.1313
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6286
    Shell Resolution(Low) 1.6766
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3041
    R-Factor(R-Work) 0.0981
    R-Factor(R-Free) 0.1234
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6766
    Shell Resolution(Low) 1.7307
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 3067
    R-Factor(R-Work) 0.1006
    R-Factor(R-Free) 0.1219
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7307
    Shell Resolution(Low) 1.7925
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3039
    R-Factor(R-Work) 0.1076
    R-Factor(R-Free) 0.1411
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7925
    Shell Resolution(Low) 1.8643
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 3076
    R-Factor(R-Work) 0.116
    R-Factor(R-Free) 0.1515
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8643
    Shell Resolution(Low) 1.9492
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.1379
    R-Factor(R-Free) 0.1533
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9492
    Shell Resolution(Low) 2.0519
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 3042
    R-Factor(R-Work) 0.1237
    R-Factor(R-Free) 0.1524
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0519
    Shell Resolution(Low) 2.1805
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2894
    R-Factor(R-Work) 0.1252
    R-Factor(R-Free) 0.1456
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1805
    Shell Resolution(Low) 2.3488
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2779
    R-Factor(R-Work) 0.1295
    R-Factor(R-Free) 0.1514
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3488
    Shell Resolution(Low) 2.5851
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3105
    R-Factor(R-Work) 0.1369
    R-Factor(R-Free) 0.1593
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5851
    Shell Resolution(Low) 2.9591
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 3093
    R-Factor(R-Work) 0.1516
    R-Factor(R-Free) 0.1663
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9591
    Shell Resolution(Low) 3.7278
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3054
    R-Factor(R-Work) 0.1525
    R-Factor(R-Free) 0.1514
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7278
    Shell Resolution(Low) 40.5202
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3111
    R-Factor(R-Work) 0.1716
    R-Factor(R-Free) 0.1675
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.098
    f_dihedral_angle_d 15.189
    f_angle_d 1.614
    f_bond_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2325
    Nucleic Acid Atoms 0
    Heterogen Atoms 123
    Solvent Atoms 358
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE: DEV_947)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: DEV_947)
    model building MOLREP