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X-RAY DIFFRACTION
Materials and Methods page
4AJV
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details 0.1 M HEPES PH 6 TO 7, 0.2 M AMMONIUM ACETATE, 20 TO 30 % PEG 3350
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.66 α = 90
    b = 56.82 β = 90
    c = 60.24 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength 0.91841
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.7
    Resolution(Low) 38.32
    Number Reflections(Observed) 4960
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.1
    B(Isotropic) From Wilson Plot 52.1
    Redundancy 3.5
     
    High Resolution Shell Details
    Resolution(High) 2.7
    Resolution(Low) 2.77
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.64
    Mean I Over Sigma(Observed) 2.3
    Redundancy 3.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.7
    Resolution(Low) 38.318
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 4959
    Number of Reflections(R-Free) 271
    Percent Reflections(Observed) 99.28
    R-Factor(Observed) 0.2242
    R-Work 0.22
    R-Free 0.2958
     
    Temperature Factor Modeling
    Mean Isotropic B Value 50.0
    Anisotropic B[1][1] -10.6555
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 21.8371
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -11.1816
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7002
    Shell Resolution(Low) 3.4017
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2288
    R-Factor(R-Work) 0.2461
    R-Factor(R-Free) 0.3686
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4017
    Shell Resolution(Low) 38.3221
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2400
    R-Factor(R-Work) 0.2094
    R-Factor(R-Free) 0.2649
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.09
    f_dihedral_angle_d 17.933
    f_angle_d 1.753
    f_bond_d 0.017
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1208
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 9
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER