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X-RAY DIFFRACTION
Materials and Methods page
4AIZ
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Details 0.2 M SODIUM CITRATE, 0.1 M HEPES, 30 % MPD, pH 7.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 89.4 α = 90
    b = 40.95 β = 90.15
    c = 106.73 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Details DOUBLE CRYSTAL CHANNEL CUT, SI(111), 1M LONG RH COATED TOROIDAL MIRROR FOR VERTICAL AND HORIZONTAL FOCUSING.
    Collection Date 2011-05-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X6A
    Wavelength 0.933
    Site NSLS
    Beamline X6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.75
    Resolution(Low) 30
    Number Reflections(Observed) 31323
    Percent Possible(Observed) 79.4
    R Merge I(Observed) 0.07
    B(Isotropic) From Wilson Plot 17.22
    Redundancy 6.8
     
    High Resolution Shell Details
    Resolution(High) 1.75
    Resolution(Low) 1.84
    Percent Possible(All) 74.3
    R Merge I(Observed) 0.37
    Mean I Over Sigma(Observed) 2.1
    Redundancy 7.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.75
    Resolution(Low) 34.224
    Cut-off Sigma(F) 1.38
    Number of Reflections(Observed) 31297
    Number of Reflections(R-Free) 1588
    Percent Reflections(Observed) 79.46
    R-Factor(Observed) 0.1689
    R-Work 0.1662
    R-Free 0.2185
     
    Temperature Factor Modeling
    Mean Isotropic B Value 22.5
    Anisotropic B[1][1] 0.2972
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0109
    Anisotropic B[2][2] 0.8386
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.1357
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.75
    Shell Resolution(Low) 1.8065
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2514
    R-Factor(R-Work) 0.2028
    R-Factor(R-Free) 0.2923
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8065
    Shell Resolution(Low) 1.8711
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2507
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.2804
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8711
    Shell Resolution(Low) 1.946
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2467
    R-Factor(R-Work) 0.1895
    R-Factor(R-Free) 0.2374
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.946
    Shell Resolution(Low) 2.0345
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2479
    R-Factor(R-Work) 0.1854
    R-Factor(R-Free) 0.2594
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0345
    Shell Resolution(Low) 2.1418
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2491
    R-Factor(R-Work) 0.1823
    R-Factor(R-Free) 0.2256
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1418
    Shell Resolution(Low) 2.2759
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2495
    R-Factor(R-Work) 0.1733
    R-Factor(R-Free) 0.2433
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2759
    Shell Resolution(Low) 2.4516
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2493
    R-Factor(R-Work) 0.1823
    R-Factor(R-Free) 0.2476
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4516
    Shell Resolution(Low) 2.6982
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.2582
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6982
    Shell Resolution(Low) 3.0885
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 2920
    R-Factor(R-Work) 0.1741
    R-Factor(R-Free) 0.2405
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0885
    Shell Resolution(Low) 3.8903
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3287
    R-Factor(R-Work) 0.1413
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8903
    Shell Resolution(Low) 34.2301
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3447
    R-Factor(R-Work) 0.151
    R-Factor(R-Free) 0.1768
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.146
    f_dihedral_angle_d 14.68
    f_angle_d 2.056
    f_bond_d 0.03
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3188
    Nucleic Acid Atoms 0
    Heterogen Atoms 41
    Solvent Atoms 405
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER