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X-RAY DIFFRACTION
Materials and Methods page
4AIX
  •   Crystallization Hide
    Crystallization Experiments
    pH 3
    Details 2.3 M AMMONIUM SULFATE, 40 % TREHALOSE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 41.88 α = 90
    b = 41.88 β = 90
    c = 170.81 γ = 120
     
    Space Group
    Space Group Name:    P 31
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD(QUANTUM 210)
    Type ADSC
    Details DOUBLE CRYSTAL CHANNEL CUT, SI(111), 1M LONG RH COATED TOROIDAL MIRROR FOR VERTICAL AND HORIZONTAL FOCUSING
    Collection Date 2011-05-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X6A
    Wavelength 0.9720
    Site NSLS
    Beamline X6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.8
    Resolution(Low) 27.65
    Number Reflections(Observed) 31131
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 16.27
    Redundancy 5.7
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.9
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.32
    Mean I Over Sigma(Observed) 2.3
    Redundancy 5.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.8
    Resolution(Low) 24.869
    Cut-off Sigma(F) 2.85
    Number of Reflections(Observed) 31070
    Number of Reflections(R-Free) 1565
    Percent Reflections(Observed) 99.99
    R-Factor(Observed) 0.1711
    R-Work 0.1684
    R-Free 0.2119
     
    Temperature Factor Modeling
    Mean Isotropic B Value 20.87
    Anisotropic B[1][1] 0.2095
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.2095
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.4189
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8001
    Shell Resolution(Low) 1.8582
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.2095
    R-Factor(R-Free) 0.2929
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8582
    Shell Resolution(Low) 1.9246
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.1878
    R-Factor(R-Free) 0.2729
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9246
    Shell Resolution(Low) 2.0016
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.175
    R-Factor(R-Free) 0.2306
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0016
    Shell Resolution(Low) 2.0926
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.1691
    R-Factor(R-Free) 0.2605
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0926
    Shell Resolution(Low) 2.2029
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.169
    R-Factor(R-Free) 0.2567
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2029
    Shell Resolution(Low) 2.3408
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.1672
    R-Factor(R-Free) 0.2436
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3408
    Shell Resolution(Low) 2.5214
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.1759
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5214
    Shell Resolution(Low) 2.7748
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2715
    R-Factor(R-Work) 0.1669
    R-Factor(R-Free) 0.2359
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7748
    Shell Resolution(Low) 3.1757
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2650
    R-Factor(R-Work) 0.1663
    R-Factor(R-Free) 0.2149
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1757
    Shell Resolution(Low) 3.9983
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.1571
    R-Factor(R-Free) 0.2073
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9983
    Shell Resolution(Low) 24.871
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.1633
    R-Factor(R-Free) 0.176
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.086
    f_dihedral_angle_d 13.085
    f_angle_d 1.133
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3180
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 356
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER