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X-RAY DIFFRACTION
Materials and Methods page
4AIF
  •   Crystallization Hide
    Crystallization Experiments
    Details 1 M AMMONIUM SULFATE, 0.1 M BIS-TRIS PH 5.5, 1% PEG 3350
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 63.82 α = 90
    b = 104.49 β = 97.41
    c = 69.27 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL (PILATUS)
    Type DECTRIS
    Collection Date 2011-09-16
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04
    Wavelength 0.9763
    Site DIAMOND
    Beamline I04
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.01
    Resolution(Low) 40.41
    Number Reflections(Observed) 29974
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 29.62
    Redundancy 3.2
     
    High Resolution Shell Details
    Resolution(High) 2.01
    Resolution(Low) 8.97
    Percent Possible(All) 98.5
    R Merge I(Observed) 0.59
    Mean I Over Sigma(Observed) 2.4
    Redundancy 3.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.006
    Resolution(Low) 40.405
    Cut-off Sigma(F) 1.4
    Number of Reflections(Observed) 29971
    Number of Reflections(R-Free) 1519
    Percent Reflections(Observed) 99.4
    R-Factor(Observed) 0.1903
    R-Work 0.1879
    R-Free 0.236
     
    Temperature Factor Modeling
    Mean Isotropic B Value 36.03
    Anisotropic B[1][1] 2.9602
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.099
    Anisotropic B[2][2] -0.1022
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.8579
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0063
    Shell Resolution(Low) 2.0711
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2559
    R-Factor(R-Work) 0.2839
    R-Factor(R-Free) 0.3514
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0711
    Shell Resolution(Low) 2.1451
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2545
    R-Factor(R-Work) 0.2435
    R-Factor(R-Free) 0.2846
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1451
    Shell Resolution(Low) 2.2309
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.2168
    R-Factor(R-Free) 0.2524
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2309
    Shell Resolution(Low) 2.3325
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2571
    R-Factor(R-Work) 0.2088
    R-Factor(R-Free) 0.2667
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3325
    Shell Resolution(Low) 2.4554
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2593
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.2864
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4554
    Shell Resolution(Low) 2.6092
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.2041
    R-Factor(R-Free) 0.2269
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6092
    Shell Resolution(Low) 2.8107
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1901
    R-Factor(R-Free) 0.2737
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8107
    Shell Resolution(Low) 3.0934
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.1865
    R-Factor(R-Free) 0.2334
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0934
    Shell Resolution(Low) 3.5408
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.175
    R-Factor(R-Free) 0.212
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5408
    Shell Resolution(Low) 4.4601
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1551
    R-Factor(R-Free) 0.1969
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4601
    Shell Resolution(Low) 40.4134
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.1809
    R-Factor(R-Free) 0.2254
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.07
    f_dihedral_angle_d 13.17
    f_angle_d 0.96
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2345
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 325
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER FOR MR
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER version: FOR MR