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X-RAY DIFFRACTION
Materials and Methods page
4AHM
  •   Crystallization Hide
    Crystallization Experiments
    Details 20 % PEG 4K, 0.4 M NA/K TARTRATE, 0.1 M NA CITRATE PH 5.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 82.27 α = 90
    b = 118.28 β = 90
    c = 37.22 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315)
    Type ADSC
    Collection Date 2008-05-17
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I02
    Wavelength 0.9796
    Site DIAMOND
    Beamline I02
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.96
    Resolution(Low) 50
    Number Reflections(Observed) 13478
    Percent Possible(Observed) 92.1
    R Merge I(Observed) 0.05
    B(Isotropic) From Wilson Plot 24.8
    Redundancy 7.5
     
    High Resolution Shell Details
    Resolution(High) 1.96
    Resolution(Low) 2.03
    Percent Possible(All) 69.0
    R Merge I(Observed) 0.18
    Mean I Over Sigma(Observed) 7.1
    Redundancy 6.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.96
    Resolution(Low) 29.571
    Cut-off Sigma(F) 0.08
    Number of Reflections(Observed) 12013
    Number of Reflections(R-Free) 1100
    Percent Reflections(Observed) 89.3
    R-Factor(Observed) 0.1982
    R-Work 0.1957
    R-Free 0.2211
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -5.053
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 19.6176
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -14.5646
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.96
    Shell Resolution(Low) 2.0492
    Number of Reflections(R-Free) 93
    Number of Reflections(R-Work) 981
    R-Factor(R-Work) 0.1918
    R-Factor(R-Free) 0.2037
    Percent Reflections(Observed) 66.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0492
    Shell Resolution(Low) 2.1572
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 1184
    R-Factor(R-Work) 0.1894
    R-Factor(R-Free) 0.2318
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1572
    Shell Resolution(Low) 2.2924
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1334
    R-Factor(R-Work) 0.2002
    R-Factor(R-Free) 0.2318
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2924
    Shell Resolution(Low) 2.4693
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1453
    R-Factor(R-Work) 0.196
    R-Factor(R-Free) 0.2481
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4693
    Shell Resolution(Low) 2.7176
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1455
    R-Factor(R-Work) 0.2091
    R-Factor(R-Free) 0.223
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7176
    Shell Resolution(Low) 3.1105
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1495
    R-Factor(R-Work) 0.2053
    R-Factor(R-Free) 0.2275
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1105
    Shell Resolution(Low) 3.9174
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1495
    R-Factor(R-Work) 0.1764
    R-Factor(R-Free) 0.205
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9174
    Shell Resolution(Low) 29.5744
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 1516
    R-Factor(R-Work) 0.1934
    R-Factor(R-Free) 0.2039
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_dihedral_angle_d 14.708
    f_angle_d 1.053
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 963
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 99
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL2000
    Data Reduction (data scaling) HKL2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER