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X-RAY DIFFRACTION
Materials and Methods page
4AHL
  •   Crystallization Hide
    Crystallization Experiments
    Details 20 % PEG 4K, 0.4 M NA/K TARTRATE, 0.1 M NA CITRATE PH 5.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 75.29 α = 90
    b = 109.75 β = 90
    c = 34.51 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2007-10-22
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SRS BEAMLINE PX10.1
    Wavelength 0.9
    Site SRS
    Beamline PX10.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.05
    Resolution(Low) 50
    Number Reflections(Observed) 9350
    Percent Possible(Observed) 93.0
    R Merge I(Observed) 0.1
    B(Isotropic) From Wilson Plot 25.98
    Redundancy 5.6
     
    High Resolution Shell Details
    Resolution(High) 2.05
    Resolution(Low) 2.12
    Percent Possible(All) 60.9
    R Merge I(Observed) 0.38
    Mean I Over Sigma(Observed) 2.5
    Redundancy 2.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.053
    Resolution(Low) 25.44
    Cut-off Sigma(F) 0.04
    Number of Reflections(Observed) 8218
    Number of Reflections(R-Free) 392
    Percent Reflections(Observed) 88.25
    R-Factor(Observed) 0.2445
    R-Work 0.2416
    R-Free 0.3035
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.407
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 9.5336
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -7.1267
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0529
    Shell Resolution(Low) 2.3498
    Number of Reflections(R-Free) 107
    Number of Reflections(R-Work) 2083
    R-Factor(R-Work) 0.2633
    R-Factor(R-Free) 0.3367
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3498
    Shell Resolution(Low) 2.9597
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2755
    R-Factor(R-Work) 0.2314
    R-Factor(R-Free) 0.3038
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9597
    Shell Resolution(Low) 25.4414
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2988
    R-Factor(R-Work) 0.2396
    R-Factor(R-Free) 0.2921
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.075
    f_dihedral_angle_d 15.121
    f_angle_d 1.992
    f_bond_d 0.018
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 955
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 36
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL2000
    Data Reduction (data scaling) HKL2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER