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X-RAY DIFFRACTION
Materials and Methods page
4AHI
  •   Crystallization Hide
    Crystallization Experiments
    Details 20 % PEG 4K, 0.05 M NA/K TARTRATE, 0.1 M NACL, 0.1 M HEPES PH 7.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 83.2 α = 90
    b = 118.67 β = 90
    c = 37.56 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (SX-165)
    Type MARRESEARCH
    Collection Date 2007-11-27
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SRS BEAMLINE PX10.1
    Wavelength 1.045
    Site SRS
    Beamline PX10.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.8
    Resolution(Low) 50
    Number Reflections(Observed) 4870
    Percent Possible(Observed) 82.8
    R Merge I(Observed) 0.09
    B(Isotropic) From Wilson Plot 42.54
    Redundancy 7.5
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.9
    Percent Possible(All) 39.4
    R Merge I(Observed) 0.18
    Mean I Over Sigma(Observed) 5.8
    Redundancy 5.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.798
    Resolution(Low) 27.88
    Cut-off Sigma(F) 0.05
    Number of Reflections(Observed) 3915
    Number of Reflections(R-Free) 193
    Percent Reflections(Observed) 80.36
    R-Factor(Observed) 0.2163
    R-Work 0.2131
    R-Free 0.2783
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -10.1786
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 19.4849
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -9.3062
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7983
    Shell Resolution(Low) 27.8817
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3722
    R-Factor(R-Work) 0.2131
    R-Factor(R-Free) 0.2783
    Percent Reflections(Observed) 80.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.078
    f_dihedral_angle_d 16.842
    f_angle_d 1.279
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 948
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 10
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL2000
    Data Reduction (data scaling) HKL2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER