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X-RAY DIFFRACTION
Materials and Methods page
4AHH
  •   Crystallization Hide
    Crystallization Experiments
    Details 20 % PEG 4K, 0.05 M NA/K TARTRATE, 0.1 M NACL, 0.1 M HEPES PH 7.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 82.89 α = 90
    b = 116.31 β = 90
    c = 37.37 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (SATURN 944)
    Type RIGAKU
    Collection Date 2010-10-20
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(Observed) 6595
    Percent Possible(Observed) 96.6
    R Merge I(Observed) 0.09
    B(Isotropic) From Wilson Plot 46.6
    Redundancy 4.6
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.59
    Percent Possible(All) 77.8
    R Merge I(Observed) 0.3
    Mean I Over Sigma(Observed) 2.3
    Redundancy 2.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.498
    Resolution(Low) 29.077
    Cut-off Sigma(F) 0.03
    Number of Reflections(Observed) 6062
    Number of Reflections(R-Free) 286
    Percent Reflections(Observed) 92.1
    R-Factor(Observed) 0.2029
    R-Work 0.2008
    R-Free 0.2422
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -6.887
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 16.8979
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -10.0109
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4984
    Shell Resolution(Low) 3.1472
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.2169
    R-Factor(R-Free) 0.2791
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1472
    Shell Resolution(Low) 29.0795
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 3128
    R-Factor(R-Work) 0.1921
    R-Factor(R-Free) 0.2195
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.077
    f_dihedral_angle_d 15.54
    f_angle_d 1.197
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 963
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 46
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL2000
    Data Reduction (data scaling) HKL2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER