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X-RAY DIFFRACTION
Materials and Methods page
4AHG
  •   Crystallization Hide
    Crystallization Experiments
    Details 20 % PEG 4K, 0.4 M NA/K TARTRATE, 0.1 M NA CITRATE PH 5.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 81.2 α = 90
    b = 119.83 β = 90
    c = 37.37 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315)
    Type ADSC
    Collection Date 2008-02-02
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04
    Wavelength 0.9695
    Site DIAMOND
    Beamline I04
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.45
    Resolution(Low) 50
    Number Reflections(Observed) 7062
    Percent Possible(Observed) 95.1
    R Merge I(Observed) 0.09
    B(Isotropic) From Wilson Plot 44.43
    Redundancy 6.1
     
    High Resolution Shell Details
    Resolution(High) 2.45
    Resolution(Low) 2.54
    Percent Possible(All) 77.7
    R Merge I(Observed) 0.33
    Mean I Over Sigma(Observed) 4.3
    Redundancy 4.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.448
    Resolution(Low) 32.66
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 6655
    Number of Reflections(R-Free) 308
    Percent Reflections(Observed) 94.3
    R-Factor(Observed) 0.2363
    R-Work 0.2343
    R-Free 0.2747
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -11.8158
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 34.2952
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -22.4794
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4483
    Shell Resolution(Low) 3.0842
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3023
    R-Factor(R-Work) 0.2606
    R-Factor(R-Free) 0.3591
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0842
    Shell Resolution(Low) 32.6628
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3324
    R-Factor(R-Work) 0.2255
    R-Factor(R-Free) 0.252
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.071
    f_dihedral_angle_d 15.903
    f_angle_d 1.353
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 960
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 7
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL2000
    Data Reduction (data scaling) HKL2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER