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X-RAY DIFFRACTION
Materials and Methods page
4AHF
  •   Crystallization Hide
    Crystallization Experiments
    Details 20 % PEG 4K, 0.05 M NA/K TARTRATE, 0.1 M NACL, 0.1 M HEPES PH 7.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 37.38 α = 90
    b = 82.96 β = 90
    c = 42.94 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE (SATURN 944)
    Type RIGAKU
    Collection Date 2010-11-25
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength 1.5417
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.11
    Resolution(Low) 50
    Number Reflections(Observed) 8151
    Percent Possible(Observed) 92.7
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 18.74
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 2.11
    Resolution(Low) 2.19
    Percent Possible(All) 92.4
    R Merge I(Observed) 0.15
    Mean I Over Sigma(Observed) 7.2
    Redundancy 3.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.115
    Resolution(Low) 34.081
    Cut-off Sigma(F) 0.09
    Number of Reflections(Observed) 7310
    Number of Reflections(R-Free) 338
    Percent Reflections(Observed) 90.38
    R-Factor(Observed) 0.2171
    R-Work 0.2136
    R-Free 0.2852
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.7337
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.7707
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.5044
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1147
    Shell Resolution(Low) 2.6642
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 3230
    R-Factor(R-Work) 0.2583
    R-Factor(R-Free) 0.365
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6642
    Shell Resolution(Low) 34.0853
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3742
    R-Factor(R-Work) 0.195
    R-Factor(R-Free) 0.252
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.071
    f_dihedral_angle_d 16.452
    f_angle_d 1.042
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 962
    Nucleic Acid Atoms 0
    Heterogen Atoms 19
    Solvent Atoms 98
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL2000
    Data Reduction (data scaling) HKL2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER