X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 7.5
Details SITTING DROPLETS WERE PREPARED BY MIXING 0.5 UL HSADRS2 AT 10.6 MG/ML (IN 50 MM HEPES-NA PH 7.5, 150 MM NACL, 0.1 MM EDTA, 10% (V/V) GLYCEROL AND 1 MM DTT) WITH 0.5 UL BOTTOM PHASE OF A BIPHASIC MIXTURE OF 50 MM BIS-TRIS PH 5.5, 20% (M/V) PEG-3350 AND 1 M AMMONIUM SULFATE AND EQUILIBRATED BY VAPOR DIFFUSION OVER 50 UL OF THE LATTER SOLUTION.

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 142.4 α = 90
b = 82.6 β = 100.4
c = 146.3 γ = 90
Symmetry
Space Group P 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL (PILATUS 6M) DECTRIS -- 2010-08-21
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA -- SLS X10SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.7 89 98.8 0.18 -- -- 7.2 -- 35768 -- -3.0 88.02
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.7 3.8 91.2 0.64 -- 2.1 4.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.7 29.916 -- 2.0 -- 35680 1780 98.82 -- 0.2222 0.2191 0.2801 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.7 3.7999 -- 123 2370 0.2974 0.3463 -- 91.0
X Ray Diffraction 3.7999 3.9115 -- 138 2622 0.281 0.3841 -- 99.0
X Ray Diffraction 3.9115 4.0374 -- 135 2573 0.2503 0.3289 -- 99.0
X Ray Diffraction 4.0374 4.1814 -- 138 2623 0.2468 0.3165 -- 99.0
X Ray Diffraction 4.1814 4.3483 -- 137 2622 0.2314 0.277 -- 99.0
X Ray Diffraction 4.3483 4.5456 -- 135 2568 0.198 0.2845 -- 99.0
X Ray Diffraction 4.5456 4.7843 -- 137 2604 0.19 0.2538 -- 99.0
X Ray Diffraction 4.7843 5.0827 -- 137 2616 0.1931 0.2488 -- 99.0
X Ray Diffraction 5.0827 5.4729 -- 139 2639 0.1989 0.2476 -- 100.0
X Ray Diffraction 5.4729 6.0196 -- 138 2618 0.2222 0.3057 -- 100.0
X Ray Diffraction 6.0196 6.8814 -- 140 2667 0.2258 0.3028 -- 100.0
X Ray Diffraction 6.8814 8.6352 -- 140 2643 0.2119 0.2565 -- 100.0
X Ray Diffraction 8.6352 29.9171 -- 143 2735 0.1998 0.2408 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 108.2
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.08
f_dihedral_angle_d 15.145
f_angle_d 1.084
f_bond_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 18840
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 0

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement
PHASER model building