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X-RAY DIFFRACTION
Materials and Methods page
4AGI
  •   Crystallization Hide
    Crystallization Experiments
    Details 200 MM CACL2, 25% PEG 4K AND 100 MM TRIS, PH 8.5 METHYL-SE-FUCOSIDE (19 MM)
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 46.69 α = 91.09
    b = 79.85 β = 88.89
    c = 84.39 γ = 103
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Details MIRRORS
     
    Diffraction Radiation
    Monochromator SI111
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength 0.9795
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.6
    Resolution(Low) 43.77
    Number Reflections(Observed) 150144
    Percent Possible(Observed) 91.8
    R Merge I(Observed) 0.04
    Redundancy 3.9
     
    High Resolution Shell Details
    Resolution(High) 1.6
    Resolution(Low) 1.69
    Percent Possible(All) 93.4
    R Merge I(Observed) 0.27
    Mean I Over Sigma(Observed) 4.1
    Redundancy 3.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.6
    Resolution(Low) 84.22
    Number of Reflections(Observed) 142614
    Number of Reflections(R-Free) 7525
    Percent Reflections(Observed) 95.67
    R-Factor(Observed) 0.15363
    R-Work 0.15194
    R-Free 0.18508
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 10.695
    Anisotropic B[1][1] -0.1
    Anisotropic B[1][2] -0.54
    Anisotropic B[1][3] 0.34
    Anisotropic B[2][2] -0.57
    Anisotropic B[2][3] -0.42
    Anisotropic B[3][3] 0.39
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.599
    Shell Resolution(Low) 1.641
    Number of Reflections(R-Free) 544
    Number of Reflections(R-Work) 10101
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.245
    Percent Reflections(Observed) 92.16
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.01
    r_chiral_restr 0.112
    r_dihedral_angle_4_deg 11.579
    r_dihedral_angle_3_deg 12.156
    r_dihedral_angle_2_deg 33.658
    r_dihedral_angle_1_deg 7.378
    r_angle_other_deg 0.962
    r_angle_refined_deg 1.689
    r_bond_other_d 0.001
    r_bond_refined_d 0.016
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9754
    Nucleic Acid Atoms 0
    Heterogen Atoms 312
    Solvent Atoms 1161
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution HKL2MAP
    Structure Refinement REFMAC 5.6.0117
     
    Software
    refinement REFMAC version: 5.6.0117
    model building HKL2MAP