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X-RAY DIFFRACTION
Materials and Methods page
4AG0
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details 0.1 M NA ACETATE PH 4.5, 0.4 M K2HPO4, 1.2 M NAH2PO4
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 64.53 α = 90
    b = 87.66 β = 90
    c = 108.24 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Collection Date 2009-03-18
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SOLEIL BEAMLINE PROXIMA 1
    Wavelength 0.9793
    Site SOLEIL
    Beamline PROXIMA 1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.3
    Resolution(Low) 46.05
    Number Reflections(Observed) 27564
    Percent Possible(Observed) 99.0
    R Merge I(Observed) 0.04
    B(Isotropic) From Wilson Plot 52.3
    Redundancy 3.6
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.44
    Percent Possible(All) 98.2
    R Merge I(Observed) 0.43
    Mean I Over Sigma(Observed) 3.13
    Redundancy 2.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.304
    Resolution(Low) 40.626
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 27552
    Number of Reflections(R-Free) 1357
    Percent Reflections(Observed) 99.09
    R-Factor(Observed) 0.2127
    R-Work 0.2091
    R-Free 0.2842
     
    Temperature Factor Modeling
    Mean Isotropic B Value 57.09
    Anisotropic B[1][1] 15.1824
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -15.329
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.1465
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3041
    Shell Resolution(Low) 2.3865
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2532
    R-Factor(R-Work) 0.3007
    R-Factor(R-Free) 0.3973
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3865
    Shell Resolution(Low) 2.482
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.2564
    R-Factor(R-Free) 0.2786
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.482
    Shell Resolution(Low) 2.595
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.2543
    R-Factor(R-Free) 0.3696
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.595
    Shell Resolution(Low) 2.7318
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.2376
    R-Factor(R-Free) 0.3236
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7318
    Shell Resolution(Low) 2.9029
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.2203
    R-Factor(R-Free) 0.3039
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9029
    Shell Resolution(Low) 3.1269
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.2407
    R-Factor(R-Free) 0.2926
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1269
    Shell Resolution(Low) 3.4414
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.2118
    R-Factor(R-Free) 0.3019
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4414
    Shell Resolution(Low) 3.9391
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.2083
    R-Factor(R-Free) 0.2942
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9391
    Shell Resolution(Low) 4.9614
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.1743
    R-Factor(R-Free) 0.2539
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9614
    Shell Resolution(Low) 40.632
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2702
    R-Factor(R-Work) 0.1923
    R-Factor(R-Free) 0.2415
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.076
    f_dihedral_angle_d 17.35
    f_angle_d 1.551
    f_bond_d 0.015
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3897
    Nucleic Acid Atoms 0
    Heterogen Atoms 19
    Solvent Atoms 115
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution BALBES
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building BALBES