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X-RAY DIFFRACTION
Materials and Methods page
4AEO
  •   Crystallization Hide
    Crystallization Experiments
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 67.18 α = 90
    b = 105.32 β = 90
    c = 106.8 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-2
    Wavelength 0.933
    Site ESRF
    Beamline ID14-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.7
    Resolution(High) 1.7
    Resolution(Low) 25.6
    Number Reflections(Observed) 79931
    Percent Possible(Observed) 95.5
    R Merge I(Observed) 0.12
    B(Isotropic) From Wilson Plot 11.44
    Redundancy 5.6
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.79
    Percent Possible(All) 93.7
    R Merge I(Observed) 0.59
    Mean I Over Sigma(Observed) 2.7
    Redundancy 5.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.7
    Resolution(Low) 25.565
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 79856
    Number of Reflections(R-Free) 8018
    Percent Reflections(Observed) 95.15
    R-Factor(Observed) 0.1752
    R-Work 0.1719
    R-Free 0.205
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.5197
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 3.5395
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.0199
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7
    Shell Resolution(Low) 1.7193
    Number of Reflections(R-Free) 273
    Number of Reflections(R-Work) 2306
    R-Factor(R-Work) 0.2167
    R-Factor(R-Free) 0.2677
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7193
    Shell Resolution(Low) 1.7395
    Number of Reflections(R-Free) 280
    Number of Reflections(R-Work) 2289
    R-Factor(R-Work) 0.2028
    R-Factor(R-Free) 0.2502
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7395
    Shell Resolution(Low) 1.7608
    Number of Reflections(R-Free) 265
    Number of Reflections(R-Work) 2320
    R-Factor(R-Work) 0.2008
    R-Factor(R-Free) 0.2504
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7608
    Shell Resolution(Low) 1.783
    Number of Reflections(R-Free) 265
    Number of Reflections(R-Work) 2307
    R-Factor(R-Work) 0.1948
    R-Factor(R-Free) 0.2487
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.783
    Shell Resolution(Low) 1.8065
    Number of Reflections(R-Free) 275
    Number of Reflections(R-Work) 2295
    R-Factor(R-Work) 0.1926
    R-Factor(R-Free) 0.2583
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8065
    Shell Resolution(Low) 1.8312
    Number of Reflections(R-Free) 231
    Number of Reflections(R-Work) 2312
    R-Factor(R-Work) 0.1808
    R-Factor(R-Free) 0.2375
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8312
    Shell Resolution(Low) 1.8574
    Number of Reflections(R-Free) 259
    Number of Reflections(R-Work) 2298
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.2371
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8574
    Shell Resolution(Low) 1.8851
    Number of Reflections(R-Free) 252
    Number of Reflections(R-Work) 2307
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.2124
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8851
    Shell Resolution(Low) 1.9145
    Number of Reflections(R-Free) 233
    Number of Reflections(R-Work) 2339
    R-Factor(R-Work) 0.1673
    R-Factor(R-Free) 0.2147
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9145
    Shell Resolution(Low) 1.9459
    Number of Reflections(R-Free) 285
    Number of Reflections(R-Work) 2286
    R-Factor(R-Work) 0.1671
    R-Factor(R-Free) 0.2201
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9459
    Shell Resolution(Low) 1.9795
    Number of Reflections(R-Free) 267
    Number of Reflections(R-Work) 2294
    R-Factor(R-Work) 0.1611
    R-Factor(R-Free) 0.2104
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9795
    Shell Resolution(Low) 2.0154
    Number of Reflections(R-Free) 256
    Number of Reflections(R-Work) 2316
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.1958
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0154
    Shell Resolution(Low) 2.0542
    Number of Reflections(R-Free) 261
    Number of Reflections(R-Work) 2344
    R-Factor(R-Work) 0.1544
    R-Factor(R-Free) 0.2101
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0542
    Shell Resolution(Low) 2.0961
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 2340
    R-Factor(R-Work) 0.1549
    R-Factor(R-Free) 0.1838
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0961
    Shell Resolution(Low) 2.1417
    Number of Reflections(R-Free) 253
    Number of Reflections(R-Work) 2351
    R-Factor(R-Work) 0.1525
    R-Factor(R-Free) 0.1939
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1417
    Shell Resolution(Low) 2.1915
    Number of Reflections(R-Free) 275
    Number of Reflections(R-Work) 2358
    R-Factor(R-Work) 0.143
    R-Factor(R-Free) 0.1995
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1915
    Shell Resolution(Low) 2.2462
    Number of Reflections(R-Free) 264
    Number of Reflections(R-Work) 2337
    R-Factor(R-Work) 0.1484
    R-Factor(R-Free) 0.1943
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2462
    Shell Resolution(Low) 2.3069
    Number of Reflections(R-Free) 284
    Number of Reflections(R-Work) 2334
    R-Factor(R-Work) 0.1549
    R-Factor(R-Free) 0.1874
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3069
    Shell Resolution(Low) 2.3748
    Number of Reflections(R-Free) 255
    Number of Reflections(R-Work) 2395
    R-Factor(R-Work) 0.154
    R-Factor(R-Free) 0.1892
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3748
    Shell Resolution(Low) 2.4514
    Number of Reflections(R-Free) 244
    Number of Reflections(R-Work) 2432
    R-Factor(R-Work) 0.1511
    R-Factor(R-Free) 0.2004
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4514
    Shell Resolution(Low) 2.5389
    Number of Reflections(R-Free) 274
    Number of Reflections(R-Work) 2388
    R-Factor(R-Work) 0.1627
    R-Factor(R-Free) 0.1863
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5389
    Shell Resolution(Low) 2.6404
    Number of Reflections(R-Free) 255
    Number of Reflections(R-Work) 2437
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.2012
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6404
    Shell Resolution(Low) 2.7605
    Number of Reflections(R-Free) 245
    Number of Reflections(R-Work) 2482
    R-Factor(R-Work) 0.1656
    R-Factor(R-Free) 0.1926
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7605
    Shell Resolution(Low) 2.9058
    Number of Reflections(R-Free) 296
    Number of Reflections(R-Work) 2482
    R-Factor(R-Work) 0.1595
    R-Factor(R-Free) 0.1967
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9058
    Shell Resolution(Low) 3.0876
    Number of Reflections(R-Free) 289
    Number of Reflections(R-Work) 2505
    R-Factor(R-Work) 0.1679
    R-Factor(R-Free) 0.1831
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0876
    Shell Resolution(Low) 3.3255
    Number of Reflections(R-Free) 272
    Number of Reflections(R-Work) 2547
    R-Factor(R-Work) 0.1753
    R-Factor(R-Free) 0.1917
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3255
    Shell Resolution(Low) 3.6593
    Number of Reflections(R-Free) 263
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.1849
    R-Factor(R-Free) 0.2201
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6593
    Shell Resolution(Low) 4.1868
    Number of Reflections(R-Free) 289
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.1651
    R-Factor(R-Free) 0.172
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1868
    Shell Resolution(Low) 5.2674
    Number of Reflections(R-Free) 308
    Number of Reflections(R-Work) 2567
    R-Factor(R-Work) 0.1851
    R-Factor(R-Free) 0.2149
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2674
    Shell Resolution(Low) 25.5674
    Number of Reflections(R-Free) 320
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.2314
    R-Factor(R-Free) 0.2275
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.07
    f_dihedral_angle_d 14.402
    f_angle_d 1.16
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5304
    Nucleic Acid Atoms 0
    Heterogen Atoms 115
    Solvent Atoms 762
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER