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X-RAY DIFFRACTION
Materials and Methods page
4AE3
  •   Crystallization Hide
    Crystallization Experiments
    Details 50 MM HEPES PH 7.6, 140 MM NACL, 11% W/V PEG5K-MME, 2% (V/V) MPD
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 88.05 α = 90
    b = 145.52 β = 90
    c = 153.83 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type BRUKER
    Collection Date 2010-09-06
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type BRUKER X8 PROTEUM
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.5
    Resolution(Low) 41.91
    Number Reflections(Observed) 34133
    Percent Possible(Observed) 98.8
    R Merge I(Observed) 0.57
    B(Isotropic) From Wilson Plot 47.465
    Redundancy 76.61
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.56
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 2.16
    Redundancy 49.39
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.5
    Resolution(Low) 41.914
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 34133
    Number of Reflections(R-Free) 1721
    Percent Reflections(Observed) 98.83
    R-Factor(Observed) 0.2158
    R-Work 0.2138
    R-Free 0.2536
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 3.5819
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.4747
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -10.0566
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.5736
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2701
    R-Factor(R-Work) 0.2711
    R-Factor(R-Free) 0.3449
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5736
    Shell Resolution(Low) 2.6566
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.2519
    R-Factor(R-Free) 0.2573
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6566
    Shell Resolution(Low) 2.7515
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.2479
    R-Factor(R-Free) 0.3001
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7515
    Shell Resolution(Low) 2.8617
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.2574
    R-Factor(R-Free) 0.3602
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8617
    Shell Resolution(Low) 2.9919
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.2542
    R-Factor(R-Free) 0.3409
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9919
    Shell Resolution(Low) 3.1496
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.2264
    R-Factor(R-Free) 0.294
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1496
    Shell Resolution(Low) 3.3468
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.2269
    R-Factor(R-Free) 0.2385
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3468
    Shell Resolution(Low) 3.6051
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.2002
    R-Factor(R-Free) 0.2356
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6051
    Shell Resolution(Low) 3.9677
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.1926
    R-Factor(R-Free) 0.2255
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9677
    Shell Resolution(Low) 4.5412
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.1771
    R-Factor(R-Free) 0.2137
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5412
    Shell Resolution(Low) 5.7191
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2745
    R-Factor(R-Work) 0.1951
    R-Factor(R-Free) 0.2327
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7191
    Shell Resolution(Low) 41.9199
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2883
    R-Factor(R-Work) 0.2151
    R-Factor(R-Free) 0.2403
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.103
    f_dihedral_angle_d 15.92
    f_angle_d 1.554
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5963
    Nucleic Acid Atoms 0
    Heterogen Atoms 89
    Solvent Atoms 439
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) PROTEUM2
    Data Reduction (data scaling) SADABS
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER