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X-RAY DIFFRACTION
Materials and Methods page
4ACV
  •   Crystallization Hide
    Crystallization Experiments
    pH 8
    Details 4M NA FORMATE, pH 8.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 122.46 α = 90
    b = 122.46 β = 90
    c = 122.46 γ = 90
     
    Space Group
    Space Group Name:    I 2 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Details MIRRORS
    Collection Date 2008-03-01
     
    Diffraction Radiation
    Monochromator SI CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID29
    Wavelength List 1.0332, 0.9792
    Site ESRF
    Beamline ID29
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.4
    Resolution(Low) 86.59
    Number Reflections(Observed) 12093
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.09
    B(Isotropic) From Wilson Plot 24.3
    Redundancy 21.7
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.53
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.36
    Mean I Over Sigma(Observed) 8.3
    Redundancy 22.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.401
    Resolution(Low) 38.724
    Cut-off Sigma(F) 1.98
    Number of Reflections(Observed) 12085
    Number of Reflections(R-Free) 577
    Percent Reflections(Observed) 99.84
    R-Factor(Observed) 0.1878
    R-Work 0.1855
    R-Free 0.2352
     
    Temperature Factor Modeling
    Mean Isotropic B Value 35.8
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4006
    Shell Resolution(Low) 2.6422
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2811
    R-Factor(R-Work) 0.1935
    R-Factor(R-Free) 0.276
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6422
    Shell Resolution(Low) 3.0244
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2866
    R-Factor(R-Work) 0.1907
    R-Factor(R-Free) 0.2818
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0244
    Shell Resolution(Low) 3.8099
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2874
    R-Factor(R-Work) 0.1781
    R-Factor(R-Free) 0.2501
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8099
    Shell Resolution(Low) 38.7291
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2957
    R-Factor(R-Work) 0.1743
    R-Factor(R-Free) 0.1892
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.06
    f_dihedral_angle_d 16.335
    f_angle_d 0.996
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1849
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 99
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution AUTOSHARP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building AUTOSHARP