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X-RAY DIFFRACTION
Materials and Methods page
4ABY
  •   Crystallization Hide
    Crystallization Experiments
    Details TRIS 0.1 M PH 7.5, 25% PEG 3350.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 129.86 α = 90
    b = 61.99 β = 102.74
    c = 133.82 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength 0.9795
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 3
    Resolution(Low) 82.3
    Number Reflections(Observed) 41994
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.12
    B(Isotropic) From Wilson Plot 46.8
    Redundancy 5.1
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.16
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.42
    Mean I Over Sigma(Observed) 3.3
    Redundancy 5.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 3.0
    Resolution(Low) 49.51
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 41983
    Number of Reflections(R-Free) 2117
    Percent Reflections(Observed) 99.41
    R-Factor(Observed) 0.2115
    R-Work 0.2095
    R-Free 0.2488
     
    Temperature Factor Modeling
    Mean Isotropic B Value 43.49
    Anisotropic B[1][1] -9.4974
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -1.9953
    Anisotropic B[2][2] 8.3617
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.1357
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9997
    Shell Resolution(Low) 3.1069
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 3972
    R-Factor(R-Work) 0.2809
    R-Factor(R-Free) 0.3194
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1069
    Shell Resolution(Low) 3.2313
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 3939
    R-Factor(R-Work) 0.2628
    R-Factor(R-Free) 0.3193
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2313
    Shell Resolution(Low) 3.3783
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 4010
    R-Factor(R-Work) 0.237
    R-Factor(R-Free) 0.2793
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3783
    Shell Resolution(Low) 3.5564
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3958
    R-Factor(R-Work) 0.2139
    R-Factor(R-Free) 0.2619
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5564
    Shell Resolution(Low) 3.7791
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 4003
    R-Factor(R-Work) 0.1949
    R-Factor(R-Free) 0.2543
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7791
    Shell Resolution(Low) 4.0708
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 4013
    R-Factor(R-Work) 0.1841
    R-Factor(R-Free) 0.2125
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0708
    Shell Resolution(Low) 4.4802
    Number of Reflections(R-Free) 228
    Number of Reflections(R-Work) 3999
    R-Factor(R-Work) 0.1744
    R-Factor(R-Free) 0.2163
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4802
    Shell Resolution(Low) 5.1279
    Number of Reflections(R-Free) 236
    Number of Reflections(R-Work) 3968
    R-Factor(R-Work) 0.1747
    R-Factor(R-Free) 0.219
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1279
    Shell Resolution(Low) 6.4584
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 3979
    R-Factor(R-Work) 0.2046
    R-Factor(R-Free) 0.2432
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.4584
    Shell Resolution(Low) 49.5165
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 4025
    R-Factor(R-Work) 0.2151
    R-Factor(R-Free) 0.24
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.053
    f_dihedral_angle_d 16.16
    f_angle_d 0.785
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10345
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 102
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHENIX
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHENIX