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X-RAY DIFFRACTION
Materials and Methods page
4ABX
  •   Crystallization Hide
    Crystallization Experiments
    Details 0.1 M HEPES PH 7, 30% PEG 6000, 1 M LICL 3% 1,2,3-HEPTANETRIOL.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.21 α = 90
    b = 43.97 β = 97.71
    c = 133.63 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Collection Date 2009-11-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength 0.9795
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 2.04
    Resolution(Low) 52.5
    Number Reflections(Observed) 52532
    Percent Possible(Observed) 97.1
    R Merge I(Observed) 0.07
    B(Isotropic) From Wilson Plot 26.6
    Redundancy 2.4
     
    High Resolution Shell Details
    Resolution(High) 2.04
    Resolution(Low) 2.15
    Percent Possible(All) 98.2
    R Merge I(Observed) 0.32
    Mean I Over Sigma(Observed) 2.8
    Redundancy 2.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.041
    Resolution(Low) 45.933
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 52510
    Number of Reflections(R-Free) 2669
    Percent Reflections(Observed) 96.68
    R-Factor(Observed) 0.2033
    R-Work 0.2008
    R-Free 0.2502
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -6.1381
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.6243
    Anisotropic B[2][2] 6.3015
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.1634
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.041
    Shell Resolution(Low) 2.0781
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.2503
    R-Factor(R-Free) 0.2985
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0781
    Shell Resolution(Low) 2.1181
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.2347
    R-Factor(R-Free) 0.2729
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1181
    Shell Resolution(Low) 2.1613
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.2235
    R-Factor(R-Free) 0.3364
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1613
    Shell Resolution(Low) 2.2083
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.2519
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2083
    Shell Resolution(Low) 2.2597
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2608
    R-Factor(R-Work) 0.19
    R-Factor(R-Free) 0.2492
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2597
    Shell Resolution(Low) 2.3162
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.1869
    R-Factor(R-Free) 0.2459
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3162
    Shell Resolution(Low) 2.3788
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.1938
    R-Factor(R-Free) 0.2518
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3788
    Shell Resolution(Low) 2.4488
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2620
    R-Factor(R-Work) 0.1897
    R-Factor(R-Free) 0.2523
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4488
    Shell Resolution(Low) 2.5278
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2620
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.257
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5278
    Shell Resolution(Low) 2.6182
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.2038
    R-Factor(R-Free) 0.2195
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6182
    Shell Resolution(Low) 2.723
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.2099
    R-Factor(R-Free) 0.2878
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.723
    Shell Resolution(Low) 2.8469
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.2272
    R-Factor(R-Free) 0.3027
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8469
    Shell Resolution(Low) 2.997
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2578
    R-Factor(R-Work) 0.2327
    R-Factor(R-Free) 0.3239
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.997
    Shell Resolution(Low) 3.1847
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.2252
    R-Factor(R-Free) 0.2677
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1847
    Shell Resolution(Low) 3.4305
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.2157
    R-Factor(R-Free) 0.2682
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4305
    Shell Resolution(Low) 3.7756
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.1906
    R-Factor(R-Free) 0.2247
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7756
    Shell Resolution(Low) 4.3216
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2605
    R-Factor(R-Work) 0.1707
    R-Factor(R-Free) 0.197
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3216
    Shell Resolution(Low) 5.4434
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.1742
    R-Factor(R-Free) 0.221
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4434
    Shell Resolution(Low) 45.9449
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.1991
    R-Factor(R-Free) 0.2372
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.044
    f_dihedral_angle_d 13.194
    f_angle_d 0.73
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4945
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 449
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution AUTORICKSHAW
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7.1_743)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.7.1_743)
    model building AUTORICKSHAW